研究目的
Investigating the fabrication of hierarchical BixOyIz/g-C3N4 heterojunctions for efficient visible-light photocatalysis.
研究成果
The study successfully fabricated hierarchical BixOyIz/g-C3N4 heterojunctions with different types, demonstrating that type-II heterojunction g-C3N4/Bi5O7I exhibits the highest photocatalytic activity due to efficient charge separation, increased surface transfer efficiency, and higher density of charge carriers. This work provides insights into the design of photocatalysts with optimized activity through heterojunction engineering.
研究不足
The study focuses on the fabrication and characterization of hierarchical heterojunctions and their photocatalytic performance under visible light. Limitations may include the specificity of the contaminants tested and the conditions under which the photocatalytic activity was evaluated.
1:Experimental Design and Method Selection:
The study involves the preparation of g-C3N4/BiOI by a direct precipitation method, and the transformation of g-C3N4/BiOI into g-C3N4/Bi4O5I2 and g-C3N4/Bi5O7I by in situ calcination at different temperatures.
2:Sample Selection and Data Sources:
Samples include g-C3N4, BiOI, Bi4O5I2, and Bi5O7I, with their composites.
3:List of Experimental Equipment and Materials:
Equipment includes X-ray diffractometer, Fourier-transform infrared spectrometer, scanning electron microscopy, transmission electron microscopy, UV-vis spectrophotometer, and thermogravimetric analyzer. Materials include melamine, Bi(NO3)3·5H2O, KI, ethylene glycol, and deionized water.
4:Experimental Procedures and Operational Workflow:
Synthesis of g-C3N4 by thermal polymerization, preparation of composites by precipitation and calcination, characterization by various techniques, and evaluation of photocatalytic activity.
5:Data Analysis Methods:
Analysis involves XRD, FTIR, SEM, TEM, UV-vis DRS, TG, and photocatalytic degradation tests.
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X-ray diffractometer
D8 Bruker AXS Advance
Bruker
Used for X-ray diffraction (XRD) analysis to study the crystal structure of materials.
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Fourier-transform infrared spectrometer
Bruker spectrometer
Bruker
Used to obtain Fourier-transform infrared (FTIR) spectra in the frequency range of 4000 cm-1-450 cm-1.
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Scanning electron microscopy
S-4800 Hitachi
Hitachi
Used to study the morphology and microstructure of samples.
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Transmission electron microscopy
JEM-2100
JEOL
Used for TEM and TEM-mapping to study the microstructure and element distribution of samples.
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UV-vis spectrophotometer
Varian Cary 5000
Varian
Used to measure UV-vis diffuse reflectance spectra (DRS) to study the photoabsorption property of materials.
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Thermal analyzer
Labsys TGDTA16
SETARAM
Used for thermogravimetric (TG) measurement to study the thermal stability and composition of materials.
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Electrochemical workstation
CHI 660E
Chenhua
Used for photoelectrochemical measurements to study the charge separation and transfer efficiency.
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Xe lamp
PLS-SXE300
Used as a light source for photocatalytic degradation tests and photoelectrochemical measurements.
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