研究目的
To verify the incorporation of oxygen in surface single-photon sources (SPSs) and to determine whether the defects attributed to surface SPSs contain oxygen.
研究成果
The study confirmed that oxidation is necessary to form surface SPSs and that oxygen is incorporated into the defects attributed to surface SPSs. The 18O-oxidized sample showed a greater number of sharp peaks, smaller sharp peak wavelengths, slightly narrower broad peaks, and stronger intensities compared to the 16O-oxidized sample, indicating the incorporation of oxygen in the defects.
研究不足
The broad emission spectrum and dispersive emission wavelengths of 600–800 nm from the surface SPSs, and the unclear defect structure of surface SPSs make device fabrication and property control difficult.
1：Experimental Design and Method Selection:
The study involved fabricating SPSs using stable 18O isotopes as oxidants and comparing them to those annealed in natural oxygen (16O2) and Ar atmospheres. Photoluminescence (PL) from the samples was observed using a confocal laser scanning ?uorescence microscope (CFM).
2：Sample Selection and Data Sources:
Epitaxial n-type 4H-SiC wafers were used. Samples were oxidized in an infrared furnace at 800 °C in a dry natural or stable-isotope oxygen (16O2/18O2) atmosphere at 5 Pa for 30 min. Another specimen was annealed in an Ar atmosphere at 800 °C and 100 kPa for 30 min.
3：List of Experimental Equipment and Materials:
Confocal laser scanning ?uorescence microscope (CFM) (WITec), single-photon counting modules (Laser Components), spectrometer with a CCD detector (Princeton Instruments), DPSS laser with a 532-nm wavelength and 1-mW net output, 600-nm long-pass ?lter.
4：Experimental Procedures and Operational Workflow:
PL intensity mapping and photon correlation measurements were performed. Low-temperature PL measurements were carried out by cooling the sample mounted in a vacuum chamber with a liquid N2 ?ow. Photon correlation measurements were performed with a standard Hanbury-Brown-Twiss interferometer.
5：Data Analysis Methods:
The second-order correlation function was used to analyze the photon correlation measurements. PL spectra were analyzed to compare peak wavelengths, widths, and intensities between samples.
独家科研数据包，助您复现前沿成果，加速创新突破
获取完整内容
