研究目的
Investigating the local, electronic, and surface structure of multi–component Fe–doped CdTe(S) systems to understand the influence of Fe doping and oxidation on the material's properties.
研究成果
Fe preferentially substitutes Cd in the CdTe lattice, causing local distortion confined to the Fe–immediate surrounding. The near–surface region is depleted from Fe and enriched in S in Cd0.99Fe0.01Te0.97S0.03. A standard–free algorithm for XPS data analysis was introduced to evaluate the composition and structure of in–depth non–uniform surfaces, revealing a monolayer of CdTeO3 passivating the surface.
研究不足
The study is limited by the sensitivity of XPS measurements to detect Fe due to its low concentration. The analysis assumes each region (bulk, oxide layer, impurity layer) is uniform and comprises a single phase, which may not account for all complexities in real samples.
1：Experimental Design and Method Selection:
XAFS, AFM, and XPS were employed to study the local structural and electronic properties, surface composition, and oxidation mechanism.
2：Sample Selection and Data Sources:
Crystalline samples Cd
3：99Fe01Te97S03 (CFTS) and Cd97Fe03Te (CFT) were grown by the Bridgman method. List of Experimental Equipment and Materials:
XAFS experiments were performed at beamline C1 of HASYLAB at Deutsches Elektronen–Synchrotron DESY. AFM images were acquired using a Multimode quadrex SPM with Nanoscope IIIe controller. XPS measurements were performed on a VSW XPS system.
4：Experimental Procedures and Operational Workflow:
Samples were oriented at 45° with respect to the incident beam for XAFS. AFM tapping mode was employed. XPS measurements were performed on as–received samples without any previous chemical treatment, followed by sputter–cleaning.
5：Data Analysis Methods:
Data processing and analysis were performed using ATHENA and ARTEMIS packages for XAFS. XPS data analysis involved a standard–free algorithm for in–depth non–uniform surfaces.
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