摘要： In this study, Cu2ZnxFe1-xSnS4 (CZFTS) (0≤x≤1) thin films were grown under vacuum evaporation on unheated glass substrates followed by sulfurization at 400 °C. The effects of sulfurization on the structural, morphological and optical properties were investigated for CZFTS material by varying Fe content. Crystal structure and phase of CZFTS thin films were analyzed by X-ray diffraction technique and Raman spectroscopy. In addition, the elemental composition and the stoichiometry of films were studied using energy dispersive spectroscopy. Surface morphology of samples was examined by scanning electron microscopy. Optical properties such as absorption coefficient, and gap energies were determined by the measurement of transmittance and reflectance in the spectral range 300-1800 nm. X-ray analysis indicates that all sulfurized CZFTS films present a polycrystalline nature and exhibit a preferential orientation along (112) plane. Cu2FeSnS4 (x=0) and Cu2ZnSnS4 (x=1) crystallize in stannite structure with I-42m and kesterite structure with I-4 space group, respectively. Raman analysis and elemental composition confirm that only the Cu2ZnSnS4 (x=1) and CZ0.75F0.25TS (x=0.75) phases are present with good crystallinity. Transmittance and reflectance spectra revealed that the films are homogenous mostly for x=0.75 and 1. Structural and optical parameters like crystallite size, absorption coefficient and band gaps were estimated for all the x values.