研究目的
Investigating the optical characteristics of strontium titanate films obtained by the sol–gel method, including their refractive indices, absorption coefficients, and the width of the forbidden band, to understand their potential applications in opto- and microelectronics.
研究成果
The layer-by-layer sol deposition onto quartz substrates increases the porosity of strontium titanate films, leading to changes in their optical properties. The refractive index decreases with increasing porosity, which enhances the films' transparency. The forbidden band width varies with the number of layers and the temperature of thermal treatment, indicating potential for tailoring the optical properties of strontium titanate films for specific applications.
研究不足
The study is limited by the assumptions that the substrate does not absorb light in the absorption band region of the film and that the light passes through the film not more than two times in the region of the intrinsic absorption band. The accuracy of determining film thickness and optical functions may vary depending on the method used.
1：Experimental Design and Method Selection:
The study used multiangle spectrophotometry and spectral ellipsometry in the UV and visible ranges to calculate the spectra of refractive indices and absorption coefficients of strontium titanate films.
2：Sample Selection and Data Sources:
Single- and five-layer strontium titanate films were deposited on quartz substrates using the sol–gel method.
3：List of Experimental Equipment and Materials:
A Photon RT spectrophotometer and a Cary-500 spectrophotometer were used for measuring transmission and reflection spectra. A Horiba UVISEL spectroscopic ellipsometer was used for measuring ellipsometric angles.
4：Experimental Procedures and Operational Workflow:
Films were deposited by centrifuging, dried, and subjected to heat treatment at temperatures ranging from 500 to 750°C. Spectra were recorded at various angles of incidence and polarizations.
5：Data Analysis Methods:
The inverse problem of spectrophotometry was solved to determine film thicknesses and optical functions. The Tauc extrapolation method was used to estimate the forbidden band width.
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