研究目的
To present a fast stand alone millimetre wave imaging scanner (SAMMITM) system capable of automatically detecting deviations from a known-good sample in various materials.
研究成果
The presented system is capable of detecting small differences in the composition and structure of a measured object against a known-good sample, with detection independent of object rotation and flexible detection thresholds.
研究不足
The system's measurement time is currently limited by mechanical considerations, requiring reduction for inline measurements.
1：Experimental Design and Method Selection:
The system operates at 90 GHz in a continuous wave mode, employing a rotating scanner system for high pixel density imaging.
2：Sample Selection and Data Sources:
Measurement objects include dielectric materials like plastics and foodstuffs.
3：List of Experimental Equipment and Materials:
Includes a rotating scanner system, RF system with direct digital synthesizers, and optical camera for image fusion.
4：Experimental Procedures and Operational Workflow:
The system scans objects placed between transmitter and receiver, processes the data to produce amplitude and phase images, and applies image processing algorithms for defect detection.
5：Data Analysis Methods:
Amplitude and phase data are analyzed using OpenCV in C++ for fast analysis.
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