研究目的
To explore the criteria for optimized heat treatment in a perovskite structure of (1–x)Bi1.05FeO3–xBaTiO3 (BF–BT100x) system, the structural phase relation, ferroelectric and piezoelectric response of BF–BT36 and BF–BT40 ceramics prepared by furnace cooling (FC) and quenching process were investigated.
研究成果
Quenching process is an effective way to enhance the dielectric, ferroelectric, and piezoelectric properties of BF-BT ceramics. Well saturated ferroelectric hysteresis loops and enhanced piezoelectric constant (d33 = 97 pC/N) were achieved by quenching process.
研究不足
The study is limited to the pseudocubic side of BF-BT system and its ferroelectric and piezoelectric properties. The effects of different heat-treatment processes were investigated only for BF–BT36 and BF–BT40 ceramics.
1:Experimental Design and Method Selection:
A conventional mixed oxide-reaction method was utilized for the preparation of (1–x)Bi
2:05FeO3–xBaTiO3 ceramics. Two heat treatment processes were performed:
furnace cooling (FC) and quenching (Q) from 1000 °C to room temperature in air.
3:Sample Selection and Data Sources:
Commercially available reagent powders of Bi2O3, Fe2O3, BaCO3, and TiO2 were used.
4:List of Experimental Equipment and Materials:
X-ray diffractometry (XRD, Rigaku, MiniFlex II), scanning electron microscopy (SEM, JP/JSM 5200, Japan), impedance analysis unit (Agilent HP4292A, USA), Berlincourt (ZJ–6B, IACAS) d33 meter, precision material analyzer (Radiant Technologies, Inc. Albuquerque, NM), contact type displacement sensor (Millitron, Model 140).
5:0). Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: The weighed ceramic powders were milled, dried, calcined, pressed into pellets, sintered, and then subjected to heat treatment. Dielectric, ferroelectric, and piezoelectric properties were characterized.
6:Data Analysis Methods:
XRD patterns were analyzed for structural phase relation, SEM for microstructure, dielectric constant and loss were calculated, piezoelectric constant was measured, and polarization hysteresis loops and electric field-induced strain were analyzed.
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X-ray diffractometry
MiniFlex II
Rigaku
Analyzing the crystal structure of sintered samples
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impedance analysis unit
HP4292A
Agilent
Calculating temperature-dependent dielectric constant and loss
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scanning electron microscopy
JSM 5200
JP
Examining surface morphology
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d33 meter
ZJ–6B
IACAS
Piezoelectric characterization
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precision material analyzer
Radiant Technologies, Inc.
Measurement of polarization hysteresis loops
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contact type displacement sensor
Model 140
Millitron
Electric field-induced strain measurement
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