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Weak Antilocalization at the Atomic-Scale Limit of Metal Film Thickness

DOI:10.1021/acs.nanolett.8b04560 期刊:Nano Letters 出版年份:2018 更新时间:2025-09-09 09:28:46
摘要: Creation of the 2D metallic layers with the thickness as small as a few atomic layers and investigation of their properties are interesting and challenging tasks of the modern condensed-matter physics. One of the possible ways to grow such layers resides in the synthesis of the so-called metal-induced reconstructions on silicon (i.e., silicon substrates covered with ordered metal ?lms of monolayer or submonolayer thickness). The 2D Au?Tl compound on Si(111) surface having 7×7 periodicity belongs to the family of the reconstructions incorporating heavy-metal atoms with a strong spin?orbit coupling (SOC). In such systems, strong SOC results in the spin-splitting of surface-state bands due to the Rashba e?ect, the occurrence of which was experimentally proved. Another remarkable consequence of a strong SOC that manifests itself in the transport properties is a weak antilocalization (WAL) e?ect, which has never been explored in the metal layers of atomic thickness. In the present study, the transport and magnetotransport properties of the 2D Au?Tl compound on Si(111) surface were investigated at low temperatures down to ~2.0 K. The compound was proved to show behavior of the 2D nearly free electron gas system with metallic conduction, as indicated by Io?e?Regel criterion. It demonstrates the WAL e?ect which is interpreted in the framework of Hikami?Larkin?Nagaoka theory, and possible mechanisms of the electron decoherence are discussed. Bearing in mind that besides the (Au, Tl)/Si(111) 7×7 system, there are many other ordered atomic-layer metal ?lms on silicon di?ering by composition, structure, strength of SOC, and spin texture, which provide a promising area for prospective investigations of the WAL e?ect at the atomic-scale limit when the ?lm thickness is less than the electron wavelength.
作者: Andrey V. Matetskiy,Nikita V. Denisov,Andrey V. Zotov,Alexander A. Saranin
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Investigation of the transport and magnetotransport properties of the 2D Au?Tl compound on Si(111) surface at low temperatures to explore the weak antilocalization (WAL) effect at the atomic-scale limit of metal film thickness.

The study represents the first observation of the WAL effect at the atomic-scale limit of metal film thicknesses in the 2D metallic Tl?Au compound on Si(111). The findings are interpreted within the framework of the HLN theory, revealing deviations of coefficient α from theoretical values and highlighting the significant role of electron?phonon interactions in the electron's phase relaxation mechanisms. The results open a promising area for prospective investigations of the WAL effect in other metal-induced reconstructions on silicon and germanium.

The study is limited by the complexity of separating various mechanism contributions from the temperature-dependent dephasing length measurements due to the extreme thickness limit of the 2D metallic-layer. Additionally, the origin of the temperature dependence of coefficient α remains unclear.

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