研究目的
To synthesize nitrogen vacancy modified graphitic carbon nitride (g-C3N4) with large surface area and investigate its photocatalytic H2-evolution activity under visible light.
研究成果
The nitrogen vacancy modified g-C3N4 exhibited enhanced visible light absorption, larger specific surface area, and improved charge separation efficiency, leading to significantly higher photocatalytic H2 evolution performance and stability. This work provides a new approach for developing efficient metal-free photocatalysts.
研究不足
The study focuses on the synthesis and photocatalytic performance of nitrogen vacancy modified g-C3N4, but does not explore the scalability of the synthesis method or the economic feasibility of large-scale production.
1：Experimental Design and Method Selection:
The synthesis involved two times heat treatment of urea to produce g-C3N4 with nitrogen vacancies.
2：Sample Selection and Data Sources:
Urea was used as the precursor for g-C3N4 synthesis.
3：List of Experimental Equipment and Materials:
Instruments included XRD, FTIR, XPS, EPR SEM, TEM, DRS, and PL. Materials included urea and a ceramic crucible.
4：Experimental Procedures and Operational Workflow:
Urea was heated to 550°C for 2 h to produce g-C3N4, which was then heat-treated at 650°C under N2 atmosphere to introduce nitrogen vacancies.
5：Data Analysis Methods:
The photocatalytic activity was evaluated by measuring H2 evolution rate under visible light.
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X-ray powder diffractometer
Bruker D8 Advance
Bruker
Measuring the X-ray diffraction patterns of samples.
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Fourier transform infrared spectroscopy
Agilent Cary 5000 spectrum 100
Agilent
Collecting FTIR spectra of samples.
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PerkinElmer series II CHNS/O analyzer
2400
PerkinElmer
Elemental analysis for carbon and nitrogen contents.
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X-ray photoelectron spectroscopy
Thermo Fisher Scientific Escalab 250
Thermo Fisher Scientific
Detecting XPS spectra of samples.
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Electron paramagnetic resonance spectrometer
Bruker EMX-10/12
Bruker
Measuring EPR spectra of samples.
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Scanning electron microscope
HITACHI SU8010
HITACHI
Examining the morphology of samples.
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Transmission electron microscopy
JEM-2100F
JEOL
Examining the microtopography of samples.
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UV–vis diffuse reflectance spectra
Agilent Cary 5000 UV–vis spectrometer
Agilent
Recording DRS of samples.
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Photoluminescence spectra
Agilent Cary Eclipse spectrometer
Agilent
Measuring PL spectra of samples.
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Quantachrome Autosorb-IQ2-MP analyzer
Quantachrome
Measuring BET surface area of samples.
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Chenhua CHI760 electrochemical station
Chenhua
Detecting transient photocurrent properties.
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Gas chromatography
GC7920
CEAULight
Analyzing the product of photocatalytic H2 evolution.
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