研究目的
Investigating the interfacial structure and magnetic behavior of Fe/MgO interfaces using in situ soft x-ray absorption spectroscopy.
研究成果
The interfacial reaction between Fe and MgO sensitively depends upon the surface condition of MgO. On a polycrystalline MgO surface, Fe forms Fe3O4, while on a single crystalline MgO (001) surface, FeO is formed. The magnetic behavior of the interfacial FeO layer is modified due to the proximity effect of the bulk ferromagnetic iron layer.
研究不足
The study is limited by the sensitivity of the techniques used in detecting a few monolayer of possible oxide at the buried interface of Fe/MgO. The absorption coefficient of escaping photoelectrons in the film is quite high, and typical escape depth in metals is in the range of a few nm only.
1：Experimental Design and Method Selection:
In situ soft x-ray absorption spectroscopy (SXAS) was used to study the interface between MgO and Fe during deposition.
2：Sample Selection and Data Sources:
Two different substrates were used: MgO (001) single crystal and a polycrystalline MgO film on Si substrate.
3：List of Experimental Equipment and Materials:
UHV deposition chamber equipped with a magnetron sputtering source, soft x-ray beamline for SXAS measurements.
4：Experimental Procedures and Operational Workflow:
Fe films were deposited on MgO substrates, and SXAS measurements were performed in total electron yield mode across the L edge of iron.
5：Data Analysis Methods:
The spectra were analyzed to identify the oxide phases present at the interface and to estimate their thickness.
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