研究目的
To achieve high dielectric performances in polymer-based nanocomposites by designing the nanostructures of fillers, their distribution inside the matrix, and interfaces with the polymer.
研究成果
The study successfully demonstrated that coating conductive Bi2S3 nanorods with insulating SiO2@PDA double layer and aligning them within PVDF matrix significantly enhances dielectric performance while suppressing loss. The anisotropic electrical properties and the effectiveness of the microcapacitor model in estimating dielectric behavior were confirmed. This approach offers a promising solution for designing high-performance dielectric materials for flexible electronics.
研究不足
The study focuses on the dielectric performance and loss suppression in polymer-based nanocomposites with specific filler structures and alignment. Potential areas for optimization include further reducing dielectric loss and enhancing dielectric constant at higher filler loadings without causing aggregation.
1:Experimental Design and Method Selection:
The study involved the design of one-dimensional semiconductor Bi2S3 nanorods coated with homogeneous SiO2 and polydopamine (PDA) double shell layers, which were then imported into poly(vinylidene fluoride) (PVDF) with parallel arrangement via uniaxial stretching to form Bi2S3@SiO2@PDA/PVDF nanocomposite.
2:Sample Selection and Data Sources:
Bi2S3 nanorods were synthesized and coated with SiO2 and PDA layers. The nanocomposites were prepared with various filler loadings.
3:List of Experimental Equipment and Materials:
Materials included PVDF powder, BiCl3, Na2S·9H2O, TEOS, ethanol, ammonia, Tris-Base, Tris-HCl, Dopamine hydrochloride, HCl, and DMF. Equipment included FESEM, HRTEM, XRD, FT-IR spectrophotometer, DSC, SAXS system, impedance analyzer, and ferroelectric test system.
4:Experimental Procedures and Operational Workflow:
The fabrication involved coating Bi2S3 nanorods with SiO2 and PDA, dispersing them in PVDF, casting films, hot-stretching, and hot-pressing to form nanocomposites.
5:Data Analysis Methods:
Dielectric properties were measured using an impedance analyzer, and J-V curves were measured on a ferroelectric test system. 3D finite element analysis was used to simulate local electric field and current density distribution.
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Tetraethoxysilane
28%
Alfa Aesar Chemical Company
Precursor for SiO2 shell coating
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Field emission scanning electron microscope
Quanta 250 FEG
FEI
Morphology observation of nanorods and composites
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High-resolution transmission electron microscopy
JEM-2100F
JEOL
Microstructure observation of core-shell nanostructures
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Impedance analyzer
4294A
Agilent Technologies, Inc.
Dielectric performance measurement
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Ferroelectric test system
Premier II
Radiant Technologies, Inc.
Current density vs. voltage measurement
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PVDF powder
Shanghai 3F company
Polymer matrix for nanocomposites
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Bismuth chloride
Sinopharm Chemical Reagent Co., Ltd.
Precursor for Bi2S3 nanorods synthesis
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Sodium sulfide
Sinopharm Chemical Reagent Co., Ltd.
Precursor for Bi2S3 nanorods synthesis
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Dopamine hydrochloride
Shanghai Macklin Biochemical Co., Ltd.
Precursor for PDA shell coating
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X-ray diffractometer
D/max-2200/PC
Phase analysis of nanorods
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Fourier transform infrared spectrophotometer
iN10MX
Nicolet
Chemical structure analysis
-
Synchronized thermal analyzer
STA-449F3
Netzsch
Thermal analysis of composites
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Small-angle X-ray scattering system
XEUSS WAXS/SAXS System
Xenocs
Crystalline structure and phase morphology characterization
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