研究目的
Investigating the radiation-induced dose and single event effects on a color CMOS camera designed for space missions, focusing on tolerance against cumulative dose effects and evaluation of single event effects.
研究成果
The CASPEX microcamera shows high tolerance against radiation, with dark current and its associated DC-RTS being the main degraded parameters due to cumulative dose effects. The study confirms the effectiveness of the anti-latchup system in protecting the CIS from damage during single event effects.
研究不足
The study is limited to the specific CMOS image sensors used in the CASPEX module and the radiation conditions tested. The impact of thicker epitaxial layers on SEL sensitivity was not explored.
1：Experimental Design and Method Selection:
The study evaluates the tolerance of a color CMOS camera against cumulative dose effects using gamma-ray and protons, and single event effects using heavy ions.
2：Sample Selection and Data Sources:
Different integrated CMOS image sensors within the CASPEX module were used, with variations in microlenses and color filters.
3：List of Experimental Equipment and Materials:
CASPEX module with different CMOS image sensors, gamma-ray and proton irradiation facilities, heavy ion testing equipment.
4：Experimental Procedures and Operational Workflow:
Irradiations were performed at ambient temperature, with electro-optic characterization before and after each irradiation.
5：Data Analysis Methods:
Analysis of noise, dark current, quantum efficiency, and glass transmission post-irradiation.
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