研究目的
Investigating the shapes of density-broadened spectral lines and measuring line shifts in high-density plasmas using the upgraded OHREX spectrometer with a CCD camera.
研究成果
The upgrade of the OHREX spectrometer with a CCD camera has significantly improved the accuracy of line-shift measurements, allowing for the observation of relative shifts on the order of several eV. The structure in the image produced by the diffraction from the crystals is highly reproducible and will ultimately limit the accuracy of spectroscopic measurements. Further experiments are planned to address potential causes of observed shifts.
研究不足
The structure observed in the image produced by the diffraction from the crystals may limit the accuracy of spectroscopic measurements. Additionally, the possibility that observed redshifts are due to material blowing off the target surface cannot be ruled out without further experiments.
1：Experimental Design and Method Selection:
The OHREX spectrometer utilizes one or two spherically bent quartz crystals to collect and analyze photons, ensuring that the spectral and spatially imaging foci coincide on the detector.
2：Sample Selection and Data Sources:
The study involved irradiating a buried silicon dot target with long-pulse and short-pulse beams to generate plasmas at different densities and temperatures.
3：List of Experimental Equipment and Materials:
The spectrometer was equipped with a Spectral Instruments 1000 Series CCD camera for detection.
4：Experimental Procedures and Operational Workflow:
The CCD camera was used to record images of spectral lines produced by the diffraction from the OHREX crystals, with the setup allowing for easy replacement of the image plate detector with the CCD camera.
5：Data Analysis Methods:
The spectral lineouts from the CCD images were analyzed to measure line shifts and observe the structure in the image produced by the diffraction from the crystals.
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