研究目的
Investigating the enhancement of piezoelectric properties in potassium-sodium niobate (KNN) based lead-free piezoelectric ceramics through the simultaneous tailoring of polymorphic phase boundary (PPB) and crystallographic texture.
研究成果
The study demonstrates that constructing polymorphic phase boundary (PPB) in conjunction with crystallographic texture of polycrystalline ferroelectric ceramics offers a highly effective means of achieving high piezoelectric properties. Superior piezoelectric properties with d33~550 pC/N and kp~72% were obtained in the <00l>c textured ceramics with R-O-T phase structure, comparable to some high-performance PZT-based piezoceramics.
研究不足
The study focuses on the enhancement of piezoelectric properties through crystallographic texture and polymorphic phase boundary in KNN-based ceramics. However, the practical application may be limited by the complexity of the fabrication process and the need for precise control over composition and texture.
1:Experimental Design and Method Selection:
The study involved tuning the polymorphic phase boundary (PPB) by incorporating different concentrations of (Bi
2:5K5)HfO3 into the matrix (K5Na5)(Nb965Sb035)O3-CaZrO3 and realizing the <00l>c crystallographic texture by templated grain growth method. Sample Selection and Data Sources:
NaNbO3 templates were synthesized using a two-step molten salt process, and KNNS-CZ-xBKH precursors were prepared by a conventional solid-state reaction method.
3:List of Experimental Equipment and Materials:
Raw materials included Na2CO3, K2CO3, Nb2O5, Sb2O3, CaCO3, ZrO2, Bi2O3, and HfO
4:Equipment used included X-ray diffraction meter (XRD, D/Max2550V, Rigaku, Japan), field emission scanning electron microscope (FE-SEM, Hitachi S-4700, Japan), and transmission electron microscopy (TEM, H-800 Electron Microscope Hitachi). Experimental Procedures and Operational Workflow:
The mixed powders were calcined, ball-milled, and tape-casted onto glass substrate. The green tapes were laminated, sintered, and then characterized for phase structure, microstructure, and properties.
5:Data Analysis Methods:
The texture quality was characterized using XRD Lotgering method, XRD rocking curve, and EBSD analyses. Piezoelectric properties were measured using a d33-meter and impedance analyzer.
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X-ray diffraction meter
D/Max2550V
Rigaku
Characterization of phase structure and texture degree of the samples
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Field emission scanning electron microscope
S-4700
Hitachi
Measurement of microstructures
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Transmission electron microscopy
H-800
Hitachi
Characterization of ferroelectric domain structures
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Piezoresponse force microscopy
Dimension Icon
Bruker
Characterization of ferroelectric domain structures
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d33-meter
ZJ-6A
Institute of acoustics, China
Collection of piezoelectric coefficient
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LCR meter
E4980A
HP
Measurement of temperature dependence of the dielectric permittivity
E4980A/E4980AL Precision LCR Meter
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Impedance analyzer
HP 4294A
HP
Determination of planar electromechanical coupling factor kp
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Ferroelectric analyzer
Precision Premier
Performance of ferroelectric hysteresis (P-E) and electric-field-induced strain measurements
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