研究目的
To produce CuI thin film via chemical extraction method and examine its structural and optical properties, and to show that these properties can be controlled by changing the bath media.
研究成果
CuI thin films produced in water bath had the best crystalline form with higher grain size and thickness. Films in chloroform and CCl4 had lower thickness and were only partially coated. The ratio of Cu/I was nearly stoichiometric in ethanol media. This method is useful and cheap for producing CuI films, particularly in ethanol, and they can be used in applications like scintillation.
研究不足
The method is not suitable for producing thin films on expensive substrates like ITO or FTO due to incomplete coverage; films were only coated on half of the substrate in some solvents like chloroform and CCl4. Potential for iodine contamination and difficulty in purification in aqueous media.
1：Experimental Design and Method Selection:
The study used chemical extraction method for depositing CuI thin films on commercial glass substrates in different chemical bath media (water, ethanol, CCl4, chloroform) to investigate structural, optical, and electrical properties. The method involved preparing solutions with specific concentrations and solvents, depositing at 50°C for 4 hours, and washing to remove excess iodine.
2：Sample Selection and Data Sources:
Substrates were commercial glass. Solutions were prepared with 1% (w/v) nitric acid, 0.005 M copper nitrate hemi hydrate, and 0.015 M potassium iodide in different solvents.
3：005 M copper nitrate hemi hydrate, and 015 M potassium iodide in different solvents.
List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Equipment included XRD (Rikagu RadB model), SEM (EVO40-LEO), AFM (Veeco Multi Mode with NanoScope 3D controller), spectrophotometer (Hach Lange DR 5000), and chemicals like nitric acid, copper nitrate hemi hydrate, potassium iodide, water, ethanol, CCl4, chloroform.
4：Experimental Procedures and Operational Workflow:
Prepared stock solutions, mixed in beakers, deposited films at 50°C for 4 hours, washed with solvent, then characterized using XRD, SEM, EDX, AFM for thickness, and spectrophotometer for optical measurements in 300-1100 nm range.
5：Data Analysis Methods:
XRD data analyzed using Scherrer formula for grain size, dislocation density, and number of crystallites per unit area; optical data used to calculate transmittance, absorption, refractive index, and extinction coefficient; SEM and EDX for surface and elemental analysis.
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