研究目的
To understand the microscopic charge separation processes of Ti4+ doped Fe2O3 photoanode before and after acid-treatment and elucidate the effects of acid-treatment on surface states and PEC performance.
研究成果
Acid-treatment passivates surface states in Ti-doped hematite photoanodes, leading to improved charge separation, reduced recombination, enhanced photovoltage, and higher PEC performance for water oxidation. This provides insights for designing efficient photoelectrodes.
研究不足
The study is limited to Ti-doped hematite and acetic acid treatment; other dopants or acids were not explored. The mechanisms are specific to the experimental conditions and may not generalize to all oxide semiconductors. Potential optimizations include varying treatment parameters and exploring other surface passivation methods.
1:Experimental Design and Method Selection:
The study involved preparing Ti-doped hematite nanorod arrays via hydrothermal synthesis, followed by acid-treatment with acetic acid. Characterization included SEM, HRTEM, XRD, XPS, UV-vis spectroscopy, SPV transient, work function measurements, and various PEC measurements to analyze charge separation and surface states.
2:Sample Selection and Data Sources:
Samples were Ti-Fe2O3 nanorod arrays on FTO substrates, with and without acid-treatment. Data were obtained from laboratory experiments using synthesized materials.
3:List of Experimental Equipment and Materials:
Equipment included SU8020 SEM, HRTEM, Rigaku D/Max-2550 XRD, Thermo Scientific Escalab 250Xi XPS, Shimadzu UV-3600 spectrophotometer, home-made SPV and transient systems, Kelvin probe (SKP 5050), CHI 660e electrochemical analyzer, xenon lamps, monochromators, and oscilloscopes. Materials included FeCl3·6H2O, NaNO3, TiCl4, acetic acid, FTO glass, and KOH electrolyte.
4:Experimental Procedures and Operational Workflow:
Hydrothermal synthesis of Ti-Fe2O3 at 100°C for 4 h, annealing at 550°C for 2 h, acid-treatment in acetic acid for 5 min, drying, and annealing at 450°C for 30 min. PEC measurements in 1 M KOH with a three-electrode setup under AM 1.5G illumination.
5:5G illumination. Data Analysis Methods:
5. Data Analysis Methods: Data analysis involved calculating IPCE, LHE, injection efficiency, Mott-Schottky plots, EIS fitting, and integration of photocurrent spikes using standard equations and software tools like lock-in amplifiers and oscilloscopes.
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Field-emission scanning electron microscope
SU8020
HITACHI
Characterization of surface morphologies
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High resolution transmission electron microscopy
HRTEM
FEI
Detailed imaging of nanostructures
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X-ray diffractometer
Rigaku D/Max-2550
Rigaku
XRD pattern analysis
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X-ray photoelectron spectroscopy spectrometer
Escalab 250Xi
Thermo Scientific
Electronic structure analysis
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UV-vis-NIR spectrophotometer
Shimadzu UV-3600
Shimadzu
Optical absorption measurement
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Xenon lamp
LSH-X500
Zolix
Light source for SPV measurements
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Grating monochromator
Omni-5007
Zolix
Monochromatic light provision
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Lock-in amplifier
SR830-DSP
Stanford
Acquisition of photovoltage signals
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Light chopper
SR540
Stanford
Modulation of light for SPV
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Nd:YAG laser
Q-smart 450
Quantel
Pulse laser for SPV transient
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Digital phosphor oscilloscope
TDS 5054
Tektronix
Signal measurement in SPV transient
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Electrochemical analyzer
CHI 660e
CH Instruments
PEC measurements
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Fluorine-doped tin oxide glass
FTO
Nippon Sheet Glass
Substrate for photoanode fabrication
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Kelvin probe instrument
SKP 5050
KP Technology Ltd
Work function measurement
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Xenon lamp
PLS-SXE300
Perfectlight
Simulated solar light source
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Irradiatometer
FZ-A
Photoelectric Instrument Factory of Beijing Normal University
Light intensity measurement
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