研究目的
To design an all-optical device that can perform XOR and XNOR functions in a single structure based on photonic crystal technology.
研究成果
The proposed all-optical XOR/XNOR gate is compact and fast, with maximum delay times of 1.5 ps for XOR and 2.5 ps for XNOR, corresponding to bit rates of 666 Gbit/s and 400 Gbit/s, respectively. It demonstrates high normalized power outputs (up to 95%) and offers a novel integration of two logic functions in one device, suitable for optical communications and data processing systems.
研究不足
The structure relies on nonlinear effects which may require high optical intensities, and the performance is simulation-based without experimental validation. The bit rates are theoretical and may vary in practical implementations.
1:Experimental Design and Method Selection:
The design involves cascading two nonlinear resonant rings in a 2D photonic crystal structure, utilizing the Kerr effect for nonlinear behavior. The finite difference time domain (FDTD) method with RSoft photonics CAD software was used for simulations.
2:Sample Selection and Data Sources:
The structure is composed of dielectric rods with specific parameters (radius 121 nm, lattice constant 607 nm) and nonlinear rods made of doped glass (refractive index 1.4, Kerr coefficient 10^-14 m2/W).
3:4, Kerr coefficient 10^-14 m2/W).
List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Simulation software (RSoft photonics CAD), theoretical models for photonic crystals and Kerr effect.
4:Experimental Procedures and Operational Workflow:
Simulations were performed with grid sizes of 37.9 nm and time step of 0.024 ns, using Gaussian optical waves at 1572 nm wavelength. Input states (A and B) were varied to observe output responses at ports O1 and O
5:9 nm and time step of 024 ns, using Gaussian optical waves at 1572 nm wavelength. Input states (A and B) were varied to observe output responses at ports O1 and OData Analysis Methods:
2.
5. Data Analysis Methods: Output power and delay times were measured from simulation results to determine logic gate functionality and bit rates.
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