研究目的
Investigating the crystal-chemical structure, band gap-grain structure, and dielectric properties of (1?x)SrTiO3-xCe0.95Zr0.05O2 composite ceramics sintered in nitrogen.
研究成果
The research concluded that the (Sr,Ce,Zr)TiO3 ceramics exhibit tetragonal structure with no ferroelectric phase, and dielectric anomalies are due to defect dipoles and oxygen vacancies. The band gap energy varies with Ce content, influenced by grain size and octahedral tilting. This provides insights into the role of defects in dielectric behavior, suggesting future studies on defect engineering for improved material properties.
研究不足
The study is limited to specific compositions (x=0.0, 0.3, 0.4) and sintering in nitrogen atmosphere; results may not generalize to other conditions or materials. Potential areas for optimization include exploring a wider range of compositions and different sintering atmospheres.
1：Experimental Design and Method Selection:
The study used mixed oxide route method for synthesis, with sintering in nitrogen atmosphere to investigate the effects on crystal structure, band gap, and dielectric properties. Theoretical models included Rietveld refinement for structural analysis and Kubelka-Munk function for band gap calculation.
2：Sample Selection and Data Sources:
Samples were prepared with compositions x = 0.0, 0.3, and 0.4 using high-purity raw powders (SrCO3, ZrO, CeO2, TiO2). Data were collected from XRD, SEM, XPS, Raman spectroscopy, UV-VIS-NIR spectroscopy, dielectric measurements, and ferroelectric loop analysis.
3：0, 3, and 4 using high-purity raw powders (SrCO3, ZrO, CeO2, TiO2). Data were collected from XRD, SEM, XPS, Raman spectroscopy, UV-VIS-NIR spectroscopy, dielectric measurements, and ferroelectric loop analysis. List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Equipment included X-ray diffractometer (Shimadzu-7000), FEI-SEM Sirion-200 field emission scanning electron microscopy, XPS (Shimadzu, AXIS-Ultra), Raman scattering spectroscopy (Horiba Jobin Yvon Lab RAM HR800), UV-VIS-NIR spectrophotometer (Perkin Elmer Lambda 1050), impedance analyzer (Agilent 4294A), high temperature system (VDMS-2000), and ferroelectric loop measurement system (RT66 B, Radiant Technologies). Materials included SrCO3, ZrO, CeO2, TiO2 (99.99% purity), PVA binder, and nitrogen gas for sintering.
4：99% purity), PVA binder, and nitrogen gas for sintering. Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: Powders were weighed, milled, calcined at 1200°C for 10h, re-milled, sieved, pressed into pellets, and sintered in nitrogen at 1300°C for 3h. Structural analysis was done via XRD, grain structure via SEM, chemical analysis via XPS, band gap via UV-VIS-NIR, dielectric properties via impedance analyzer and Raman spectroscopy, and ferroelectric properties via Sawyer-Tower circuit.
5：3h. Structural analysis was done via XRD, grain structure via SEM, chemical analysis via XPS, band gap via UV-VIS-NIR, dielectric properties via impedance analyzer and Raman spectroscopy, and ferroelectric properties via Sawyer-Tower circuit. Data Analysis Methods:
5. Data Analysis Methods: Data were analyzed using GSAS cell software for lattice parameters, Image pro plus and Nano Measurer for grain size, Kubelka-Munk function for band gap, and Arrhenius equation for activation energy in conductivity analysis.
独家科研数据包，助您复现前沿成果，加速创新突破
获取完整内容-
X-ray diffractometer
Shimadzu-7000
Shimadzu
Used for structural analysis via X-ray diffraction to examine crystal structure of ceramics.
-
Field emission scanning electron microscopy
FEI-SEM Sirion-200
FEI
Used to study grain structure and microstructure of the ceramics.
-
X-ray photoelectron spectroscopy
AXIS-Ultra
Shimadzu
Used for chemical structure analysis to understand electronic and surface environments.
-
UV-VIS-NIR spectrophotometer
Lambda 1050
Perkin Elmer
Used to calculate optical band gap via diffused reflectance spectroscopy.
-
Impedance analyzer
Agilent 4294A
Agilent
Used for temperature-dependent dielectric and loss measurements.
-
Ferroelectric loop measurement system
RT66 B
Radiant Technologies
Used for recording polarization hysteresis loops at room temperature.
-
Raman scattering spectroscopy
Lab RAM HR800
Horiba Jobin Yvon
Used to confirm relaxor-like dielectric behavior via composition-dependent analysis.
-
High temperature system
VDMS-2000
Partulab
Used for dielectric measurements in the temperature range 0°C to 450°C.
-
登录查看剩余6件设备及参数对照表
查看全部
