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[IEEE 2018 International Joint Conference on Neural Networks (IJCNN) - Rio de Janeiro (2018.7.8-2018.7.13)] 2018 International Joint Conference on Neural Networks (IJCNN) - Defect classification in shearography images using convolutional neural networks

DOI:10.1109/IJCNN.2018.8489133 出版年份:2018 更新时间:2025-09-19 17:15:36
摘要: High subjectivity, lack of attention and fatigue are factors inherent to human analysis in inspection activities such as shearography, a non-destructive optical method. In order to minimize the probability of human error, a study was conducted in which a binary classification from 256 shearography test samples obtained from pipes repaired with glass fiber patches was performed. The dataset was split into major and minor defects and used to train two convolutional neural networks architectures, - a specific artificial neural network well known for its application on image classification. Architecture A achieved a maximum accuracy of 73% on major defect detection, while architecture B, slightly more complex, led to better results. Posterior studies on architecture B led to the conclusion that a combination of double layer filters and dropout layers are the best setup for this type of classification problem. It is possible that other architectures might lead to better results, but no grid search was performed to confirm this assumption. An accuracy of 79% was achieved with Architecture B, therefore is reasonable to say that convolutional neural networks are able to learn from parameters which are difficult to correctly process, such as the fringe patterns obtained from shearography test samples.
作者: Herberth Birck Fr?hlich,Analucia Vieira Fantin,Bernardo Cassimiro Fonseca de Oliveira,Daniel Pedro Willemann,Lucas Arrigoni Iervolino,Mauro Eduardo Benedet,Armando Albertazzi Gon?alves Júnior
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To minimize the probability of human error in shearography inspection by developing a convolutional neural network for binary classification of defects in shearography images.

Convolutional neural networks can learn from shearography fringe patterns, with architecture B achieving 79% accuracy in binary defect classification. The combination of double filter layers and dropout layers is effective. Future work should involve multi-classification and parameter engineering for better defect characterization.

The dataset is small (294 samples), which may limit model performance. No grid search was performed to explore all possible hyperparameter combinations, and the study focused only on binary classification, not multi-classification. Accuracy achieved (79%) is considered low, potentially due to the small dataset.

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