研究目的
To develop a low-cost, low-temperature, and high-speed thin-film deposition method using microwave-excited atmospheric pressure plasma jet (MWAPPJ) for fabricating zinc oxide (ZnO) nanosheets, and to apply these films as an electron collection layer in organic photovoltaic (OPV) cells to reduce manufacturing costs.
研究成果
The study successfully developed a low-cost, low-temperature, and high-speed thin-film deposition method using MWAPPJ for ZnO nanosheets. Increasing the number of mesh targets promoted sediment growth and shape change from particles to rods. XPS confirmed enhanced Zn-O bonds with oxygen mixture. Preliminary OPV results showed promise, with a PCE of 0.23%, indicating potential for cost-effective solar cell production. Future work should focus on optimization to enhance performance.
研究不足
The OPV devices incorporating MWAPPJ-processed ZnO thin-films were not fully optimized, resulting in lower efficiency compared to sol-gel methods. The deposition method may require further refinement to improve film quality and device performance. The use of multiple mesh targets increases complexity, and the process might not be scalable without additional adjustments.
1：Experimental Design and Method Selection:
The experiment involved using a microwave-excited atmospheric pressure plasma jet (MWAPPJ) for thin-film deposition. The method was chosen for its ability to produce low-temperature plasma without vacuum equipment, enabling high-speed deposition. Theoretical models include plasma generation and sol-gel chemistry.
2：Sample Selection and Data Sources:
Zinc acetylacetonate (Zn(acac)2) sol-gel precursors were coated on stainless steel mesh targets (10 mm × 10 mm). Silicon substrates were used for deposition. Data on film morphology and properties were obtained from SEM and XPS analyses.
3：List of Experimental Equipment and Materials:
Equipment includes MWAPPJ device with 2.45 GHz microwave power supply, multifunction generator, E-H tuner, quartz tube, infrared thermal image camera (InfReC R300SR, NIPPON AVIONICS CO., LTD.), FE-SEM (JSM-7610F, JEOL Ltd.), XPS (JPS-9010MC, JEOL Ltd.), Keithley 2400 digital source meter, spin-coater (Mikasa Co. Ltd.), N2-filled globe-box (NEXUS II, VAC), and thermal evaporation system. Materials include helium gas, oxygen gas, Zn(acac)2, 2-methoxyethanol, acetylacetone, stainless steel mesh, silicon substrates, ITO substrates, P3HT, PC61BM, MoO3, and Au.
4：45 GHz microwave power supply, multifunction generator, E-H tuner, quartz tube, infrared thermal image camera (InfReC R300SR, NIPPON AVIONICS CO., LTD.), FE-SEM (JSM-7610F, JEOL Ltd.), XPS (JPS-9010MC, JEOL Ltd.), Keithley 2400 digital source meter, spin-coater (Mikasa Co. Ltd.), N2-filled globe-box (NEXUS II, VAC), and thermal evaporation system. Materials include helium gas, oxygen gas, Zn(acac)2, 2-methoxyethanol, acetylacetone, stainless steel mesh, silicon substrates, ITO substrates, P3HT, PC61BM, MoO3, and Au.
Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: The MWAPPJ was set up with He gas flow at 3 slm, duty ratio of 50%, input power of 50 W, and plasma irradiation time of 60 s. Distances: d1 (quartz tube to target) = 1.5 mm, d2 (target to substrate) = 5.0 mm. The ZnO precursor-coated mesh was irradiated, leading to deposition on Si substrates. For OPV fabrication, ZnO films were spin-coated or deposited, followed by active layer deposition, MoO3 evaporation, and Au electrode deposition. Surface temperature was monitored using an infrared camera.
5：5 mm, d2 (target to substrate) = 0 mm. The ZnO precursor-coated mesh was irradiated, leading to deposition on Si substrates. For OPV fabrication, ZnO films were spin-coated or deposited, followed by active layer deposition, MoO3 evaporation, and Au electrode deposition. Surface temperature was monitored using an infrared camera.
Data Analysis Methods:
5. Data Analysis Methods: SEM was used for morphological analysis at 5 kV operating voltage. XPS was used for chemical bonding analysis with Mg Kα source, pass energy of 10 eV. J-V characteristics were measured using a Keithley 2400 under AM 1.5 G solar illumination.
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