研究目的
To address polarization sensitivity in photonic integration devices by proposing a broadband silicon polarization splitter-rotator (PSR) and demonstrating its application in a polarization-insensitive WDM receiver.
研究成果
The proposed PSR achieves low insertion loss and crosstalk over a broad wavelength range. Integration with AWGs and PDs results in a polarization-insensitive WDM receiver with low PDL and clear eye diagrams at 10 Gb/s, demonstrating feasibility for high-speed optical communications.
研究不足
The crosstalk is not as low as expected due to the low polarization extinction ratio of the laser used. The bandwidth of the Ge PD is limited to about 7 GHz due to large size and high RC constant, which could be optimized by reducing the active area dimensions.
1：Experimental Design and Method Selection:
The PSR is designed using a bi-level taper and a counter-tapered coupler based on mode hybridization principles for broadband operation and large fabrication tolerance. Simulation and experimental validation are conducted.
2：Sample Selection and Data Sources:
Fabricated on a
3：13 μm CMOS platform using SOI wafers. Testing involves tunable laser sources and polarization control. List of Experimental Equipment and Materials:
Includes tunable laser, polarization controller, linear polarizer system, power-meter, SOI wafers, silicon waveguides, germanium photodetectors, and CMOS fabrication tools.
4：Experimental Procedures and Operational Workflow:
Fabrication involves LPCVD for SiN mask, 248 nm lithography, ICP-RIE etching, and SiO2 deposition. Testing setup includes aligning polarization states and measuring insertion loss, crosstalk, and PDL.
5：Data Analysis Methods:
Data is normalized using reference waveguides; insertion loss, crosstalk, and PDL are calculated from measured power values.
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tunable laser
Provides tunable light source for testing the PSR and WDM receiver over a wavelength range.
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polarization controller
Adjusts the polarization state of incident light for experimental control and verification.
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linear polarizer system
Selects polarization components of output light by rotating the polarizer.
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power-meter
Measures optical power during experiments to determine insertion loss and other parameters.
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SOI wafer
Substrate for fabricating the photonic devices, including waveguides and PDs.
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germanium photodetector
Converts demultiplexed optical signals into electrical signals in the WDM receiver.
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arrayed waveguide grating
1 × 8 silicon AWG
Demultiplexes optical signals by wavelength in the WDM receiver.
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LiNbO3 modulator
commercial
Modulates light for high-speed operation testing of the WDM receiver.
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EDFA
Amplifies optical signals in the testing setup for eye diagram measurements.
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optical narrowband filter
Filters out spontaneous emission noise from the EDFA in the testing system.
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