研究目的
To investigate the effect of substrate temperature on the structural, morphological, optical, and electrical properties of NiO thin films deposited by spray pyrolysis.
研究成果
NiO thin films deposited by spray pyrolysis exhibit polycrystalline cubic structure with properties highly dependent on substrate temperature. Crystallite size, optical band gap, and electrical conductivity increase with temperature, confirming semiconducting behavior. The findings suggest that substrate temperature is a critical parameter for optimizing NiO thin films for applications in optoelectronics and energy devices.
研究不足
The study is limited to a specific temperature range (350–390°C) and uses a simple spray pyrolysis setup, which may not be optimized for all parameters. Potential areas for optimization include exploring a wider temperature range, different precursors, or advanced deposition techniques to enhance film properties.
1：Experimental Design and Method Selection:
The study used a spray pyrolysis technique to deposit NiO thin films on glass substrates at temperatures ranging from 350°C to 390°C. The method was chosen for its simplicity, low cost, and suitability for large-area applications.
2：Sample Selection and Data Sources:
Nickel nitrate (Ni(NO3)2·6H2O,
3：1 M, AR grade, SD fine, 5% pure) was dissolved in aqueous solution and sprayed onto preheated glass substrates. The substrates were cleaned ultrasonically in acetone and rinsed in distilled water. List of Experimental Equipment and Materials:
Equipment included a homemade chemical spray pyrolysis setup, thermogravimetric analyzer (TGA) and differential thermal analyzer (DTA) (Shimadzu 50), X-ray diffractometer (XRD Bruker AXS D8 Advance Model with Cu-Kα radiation), field emission-scanning electron microscope (FE-SEM SU8000 Hitachi), UV-visible spectrophotometer (Perkin Elmer Lambda 1050 UV-Vis-NIR), and a two-point probe resistivity unit. Materials included nickel nitrate and glass substrates.
4：Experimental Procedures and Operational Workflow:
The precursor solution was sprayed onto substrates at specified temperatures. TGA/DTA was performed to determine decomposition temperature. XRD was used for structural analysis, FE-SEM for morphology, UV-Vis for optical properties, and electrical measurements for conductivity.
5：Data Analysis Methods:
Data were analyzed using Scherrer's formula for crystallite size, equations for microstrain, dislocation density, texture coefficient, optical band gap (using Tauc plot), extinction coefficient, refractive index, dielectric constants, optical conductivity, and electrical resistivity with Arrhenius equation for activation energy.
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