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[IEEE 2019 IEEE Conference on Control Technology and Applications (CCTA) - Hong Kong, China (2019.8.19-2019.8.21)] 2019 IEEE Conference on Control Technology and Applications (CCTA) - Novel Micro Scanning with Integrated Atomic Force Microscope and Confocal Laser Scanning Microscope
摘要： Integrated atomic force microscope (AFM) and confocal laser scanning microscope (CLSM) can quickly obtain the three-dimensional (3-D) surface of the sample in large scanning range and recover the region of interesting (ROI) in nanoscale resolution. However, the traditional cooperative algorithm for integrated microscopes occupies too much scanning time. In this work, we develop a novel cooperative algorithm for the integrated microscopes to reduce scanning time of AFM and achieve higher scanning speed. First, the calibration of the microscopes will be implemented. Next, CLSM starts a large range scan first and then define the region of interesting (ROI) by edge detection. And then, the scan regions of the AFM are arranged based on the ROI and adaptive scanning region method is proposed to reduce the scanning time. Furthermore, variable speed scanning based on the height information obtained from CLSM image is applied to increase the AFM scanning speed. Finally, the scanning images obtained from AFM and CLSM are merged together. A series of experimental results show that proposed cooperative algorithm can save approximately 69.2% of scanning time compared with that obtained by traditional cooperative algorithm.
关键词： Atomic force microscope (AFM),adaptive scanning range,confocal laser scanning microscope (CLSM),regions of interest (ROI),variable speed scanning
更新于2025-09-16 10:30:52
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Micron-Sized Constrictions Fabricated Using the Femtosecond Laser Technique on YBCO Thin Films
摘要： In this paper, I report on the fabrication of micron-sized constrictions in YBCO thin films using the femtosecond laser technique. The constrictions are S-shaped superconducting weak links fabricated on YBCO thin films. The constrictions show a measurable superconducting current flowing through them. Current-voltage (I–V) characteristics were used to determine the critical current IC of the constrictions at 77 K. The width of the constrictions was determined at the narrowest point using SEM (scanning electron microscope). Three micron-sized constrictions were fabricated with a width of 2.88 μm, 1.72 μm, and 1.69 μm and a length of 5 μm. Based on the width and length of these constrictions in relation to the coherence length (ξ) of the YBCO, these constrictions should conduct supercurrent by Abrikosov vortices. The SEM images show that the femtosecond laser heats the samples beyond the geometric boundary, damaging some of the superconductive phases of the YBCO constrictions. As a result, the constrictions conduct current by one-dimensional depairing.
关键词： Atomic force microscope (AFM),Abrikosov vortices,Flux pinning,YBCO thin film,Lasers,Critical currents,Scanning electron microscopy (SEM)
更新于2025-09-11 14:15:04