Crystal growth and optical properties of Ca <sub/>3</sub> TaGa <sub/>3</sub> Si <sub/>2</sub> O <sub/>14</sub> single crystals

摘要： Transparent yellowish Ca3TaGa3Si2O14 single crystals were grown in Ar+(0.5–3)% O2 along the Y-axis by the Czochralski technique. The structural perfection of Ca3TaGa3Si2O14 samples was studied by X-ray topography and rocking curve methods. Topograms and rocking curves along the surfaces of the Y- and Z-cuts were studied before and after surface treatments (polishing and etching). Transmittance spectra were measured in the wavelength range of 200–3300 nm. Optical anisotropy was studied along the X- and Z-axes, and dichroism along the X-axis. The dispersions of the refractive index No and speci?c rotation of the polarization plane were determined using spectrophotometric methods.