Analysis of nonlinear large signal intrinsic elements for InGaP/GaAs HBT based on Gummel-Poon model

摘要： A large signal analysis method based on Gummel‐Poon model is proposed to predict nonlinear behavior of InGaP/GaAs HBT. A 2 × 20 μm2 transistor is fabricated with InGaP/GaAs HBT technology. The large signal transconductance Gm, conductance Gbe, and capacitance CBE, CBC are calculated based on the proposed method and measured using a RF testing probe. The calculated and measured results show good consistency up to nonlinear power level. The proposed method is applied to analyze variations of nonlinear large signal intrinsic elements of this transistor with increasing power under different bias conditions, in order to raise benefit of nonlinear consideration for power amplifiers.