Photovoltaic Module Reliability || Failure Analysis Tools

摘要： Regardless of whether a module has degraded from field exposure or accelerated stress testing, it is important to understand what has actually changed within the module that led to lost peak power. If we want to use the results to improve the module construction so that future modules will not degrade, we must understand what particular changes have occurred. In this chapter, we will explore some of the methods used to better understand what has gone wrong within the module. Methods reviewed include, analysis of the I–V parameters, measurement of performance at different irradiances, visual inspection, Infrared (IR) Inspection, Electroluminescence (EL) and evaluation of adhesion. Each will be discussed in the subsections that follow.