- 标题
- 摘要
- 关键词
- 实验方案
- 产品
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Photovoltaic Cooling Utilizing Phase Change Materials
摘要： A theoretical analysis based on mathematical formulations and experimental test to a photovoltaic system cooled by Phase Change Material (PCM) is carried out and documented. The PCM is attached to the back of the PV panel to control the temperature of cells in the PV panel. The experimental tests were done to solar systems with and without using PCM for comparison purposes. A PCM of paraffin graphite panels of thickness15 mm has covered the back of the panel. This layer was covered with an aluminum sheet fixed tightly to the panel frame. In the experimental test, it was found that when the average cell temperature exceeds the melting point temperature of the PCM, the efficiency of the system increases. However, when the cell temperature did not exceed the melting temperature of the PCM, the use of the PCM will affect negatively the system efficiency.
关键词： Photovoltaic Cooling,PCM melting point,PV panel efficiency,Phase Change Materials
更新于2025-09-23 15:19:57
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Potential of Indium Plating Chemistry; インジウムめっきの可能性;
摘要： インジウムは 19 世紀後半から装飾用途および軸受用途として利用されてきたが，近年では化合物半導体，電極，液晶セル，はんだ，低融点合金など，電気?電子工業分野における利用が増加している。その中でも透明電極用 ITO（Indium Tin Oxide，酸化インジウムスズ）用途がインジウム需要の約 85% を占めている。めっき浴としては，電解めっきおよび無電解めっきに大別される。古くからインジウムおよびインジウム合金の様々の浴種の提案がされているが，近年では新規めっき浴の提案よりも，現行浴を用い，熱拡散や低融点を利用した検討が多い。今回，本稿ではインジウムの特性，用途，各種めっき液を簡単に紹介するとともに著者らが最近開発した技術についても紹介する。
关键词： Low Melting Point,Flip-Chip,Plating,Indium,Pb-Free
更新于2025-09-19 17:15:36
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Measurement and Evaluation of Local Surface Temperature Induced by Irradiation of Nanoscaled or Microscaled Electron Beams
摘要： Electron beams (e-beams) have been applied as detecting probes and clean energy sources in many applications. In this work, we investigated several approaches for measurement and estimation of the range and distribution of local temperatures on a subject surface under irradiation of nano-microscale e-beams. We showed that a high-intensity e-beam with current density of 105-6 A/cm2 could result in vaporization of solid Si and Au materials in seconds, with a local surface temperature higher than 3000 K. With a lower beam intensity to 103-4 A/cm2, e-beams could introduce local surface temperature in the range of 1000–2000 K shortly, causing local melting in metallic nanowires and Cr, Pt, and Pd thin films, and phase transition in metallic Mg-B films. We demonstrated that thin film thermocouples on a freestanding Si3N4 window were capable of detecting peaked local surface temperatures up to 2000 K and stable, and temperatures in a lower range with a high precision. We discussed the distribution of surface temperatures under e-beams, thermal dissipation of thick substrate, and a small converting ratio from the high kinetic energy of e-beam to the surface heat. The results may offer some clues for novel applications of e-beams.
关键词： Vaporization,Local temperature,Nanoscale thermometry,Transmission electron microscopy,Thin film thermocouple,Energy converting,Electron beam,Scanning electron microscopy,Melting point
更新于2025-09-11 14:15:04
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Simplified expressions for calculating Debye temperature and melting point of II-VI and III-V semiconductors
摘要： Simple empirical expressions between the Debye temperature and the bond length and also between the melting point and the bond length have been proposed. These formulas have been established for two groups of ANB8-N type binary semiconductors (groups: II-VI and III-V). A good correlation between the Debye temperature and the bond length and also between the melting point and the bond length is obtained. The minimum average percentage deviations in the present approach reveal that our model proves its identity and soundness compared to those of other author relations.
关键词： Melting Point,AII-BVI and AIII-BV Binary Compounds,Debye Temperature,Bond Length
更新于2025-09-04 15:30:14