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Datasets on extinction coefficients for free space optical link survey and optimization
摘要： Based on visibilities data recorded from 2004 to 2013, the minimum, maximum and mean values of extinction coefficients were determined and analyzed in a monthly basis, a yearly basis and also for the whole period of observation. The extinction coefficients data are obtained for the 1330 and 1550 nm optical wavelengths and may be used inter alia for range and availability analyses of optical link for different weather conditions. The data are collected in the region of Dakar, but approach and model of investigation can be reproduced for other regions in Sahel, and in the World, for optical metrology and allied fields of study.
关键词： Optical signal metrology in atmosphere,Free Optical communication
更新于2025-09-23 15:23:52
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Dynamic Measurement Error Modeling and Analysis in a Photoelectric Scanning Measurement Network
摘要： A photoelectric scanning measurement network is a kind of distributed measurement system based on the principle of angle intersection, in which transmitters and photoelectric receivers are the main parts. The scanning lasers in transmitters emit signals and they are obtained by receivers at the measured points. Then the coordinate of the receiver can be calculated by the optimization algorithm. Its outstanding static measurement performance and network scalability capacity give it great potential in large-scale metrology. However, when it comes to moving targets, the angle intersection failure will produce a dynamic error, which limits its further application. Nowadays the research on error modeling and compensation is also insufficient though it has been the crucial concern. In this paper, we analyzed error causes and constructed a dynamic error model. Dynamic error characteristics and the law of propagation were discussed. The measurement uncertainty at different movement speeds was quantized through simulation experiments. To verify the error model, experiments were designed and the dynamic error was evaluated in practice. It matched well with simulations. The model was tested to be reasonable, and provided theoretical support for error compensation.
关键词： angle intersection,large-scale metrology,dynamic error modeling,Photoelectric scanning
更新于2025-09-23 15:23:52
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A Comparative Study of Gas Sensing Properties of Tungsten Oxide, Tin Oxide and Tin-Doped Tungsten Oxide Thin Films for Acetone Gas Detection
摘要： Nowadays, various metal oxide thin films have been used for the purpose of gas sensing. This research depicts a comparison of gas sensing properties among four different metal oxide thin films, namely, tungsten dioxide (WO2), tungsten trioxide (WO3), tin oxide (SnO2) and tin doped tungsten trioxide (Sn-doped WO3), for detecting acetone gas. Each metal oxide thin film was subjected to acetone gas flow of various concentrations and the corresponding changes in resistance were calculated. Characterizations such as x-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and gas sensing characterization for recording resistance changes have been performed. Each film was annealed at different temperatures for 1 h (WO2 and WO3 at 500°C, SnO2 at 300°C and Sn-doped WO3 at 400°C) so as to achieve an optimum grain size for sensing. The XRD patterns reveal formation of an orthorhombic phase of WO2, hexagonal phase of WO3 and orthorhombic phase of SnO2. AFM and SEM depict clear images of grain boundaries on the film. SnO2 has been found to be the best thin film for sensing acetone gas. Operational optimum temperature for sensing acetone gas has been calculated for each thin film (260°C for WO2, 220°C for WO3, 360°C for SnO2 and 300°C for Sn-doped WO3). It can detect a very low concentration of 1.5 ppm acetone gas with a good resistance response change of 30%. Various concentrations of acetone gas, namely, 1.5 ppm, 3 ppm, 5 ppm, 7 ppm, 10 ppm, 15 ppm and 20 ppm, have been detected using these metal oxide thin films, and thus the comparison has been made. The response time for SnO2 is approximately 3 min and recovery time is approximately 4 min.
关键词： tungsten oxide,acetone gas detection,topography,tin oxide,Metal oxide thin films,surface metrology,gas sensing,tin-doped tungsten oxide
更新于2025-09-23 15:23:52
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Benchmarking of graphene-based materials: real commercial products vs. ideal graphene
摘要： There are tens of industrial producers claiming to sell graphene and related materials (GRM), mostly as solid powders. Recently the quality of commercial GRM has been questioned, and procedures for GRM quality control were suggested using Raman Spectroscopy or Atomic Force Microscopy. Such techniques require dissolving the sample in solvents, possibly introducing artefacts. A more pragmatic approach is needed, based on fast measurements and not requiring any assumption on GRM solubility. To this aim, we report here an overview of the properties of commercial GRM produced by selected companies in Europe, USA and Asia. We benchmark: A) size, B) exfoliation grade and C) oxidation grade of each GRM vs. the ones of 'ideal' graphene and, most importantly, vs. what reported by the producer. In contrast to previous works, we report explicitly the names of the GRM producers and we do not re-dissolve the GRM in solvents, but only use techniques compatible with industrial powder metrology. A general common trend is observed: products having low defectivity (%sp2 bonds >95%) feature low surface area (<200 m2/g), while highly exfoliated GRM show a lower sp2 content, demonstrating that it is still challenging to exfoliate GRM at industrial level without adding defects.
关键词： industrial materials,metrology,graphene,X-rays photoelectron spectroscopy,materials characterization
更新于2025-09-23 15:23:52
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[IEEE 2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) - Amsterdam (2018.8.27-2018.8.30)] 2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) - High-Resolution Near-Field Imaging and Far-Field Antenna Measurements with Atomic Sensors
摘要： Measurements of radio-frequency (RF) electric fields using atomic sensors based on quantum-optical spectroscopy of Rydberg states in vapors has garnered significant interest in recent years for the establishment of atomic standards for RF electric fields and towards the development of novel RF sensing instrumentation. Here we describe recent work employing atomic sensors for sub-wavelength near-field imaging of a Ku-band horn antenna. We demonstrate near-field imaging capability at a spatial resolution of λ/10 and measurements over a 72 to 240 V/m field range using off-resonance AC-Stark shifts of a Rydberg-atom resonance. A fiber-coupled atomic-sensor probe is also employed in far-field measurements of a WR-90 standard gain horn.
关键词： electromagnetic compatibility,Rydberg,atom,quantum sensing,RF,metrology,antenna characterization,microwave,Atomic sensors,electric field,antenna,radio-frequency
更新于2025-09-23 15:23:52
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Uncertainty analysis for ac–dc difference measurements with the AC Josephson voltage standard
摘要： A detailed analysis of the uncertainties obtained in ac–dc difference measurements with an AC Josephson voltage standard (ACJVS) is presented. For audio frequencies and for voltages less than 200 mV, ac–dc transfers with the ACJVS may reduce the combined uncertainty by factors of 2–10, compared with conventional methods based on thermal converters. Type A uncertainties are predominantly limited by the thermal transfer standard (TTS), or the digital voltmeter used to acquire the output voltage from the TTS. In agreement with earlier work, the transmission line is the primary contributor to Type B errors for frequencies above 10 kHz. A Monte Carlo sensitivity analysis is used to demonstrate how the uncertainties of transmission line impedance and on-chip inductance impact the accuracy of the rms amplitude conveyed to the TTS.
关键词： ac voltage metrology,transmission line analysis,Josephson junction arrays,quantum voltage standards,uncertainty analysis
更新于2025-09-23 15:22:29
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High-gain optical injection locking amplifier in phase-coherent optical frequency transmission
摘要： Optical amplification, which is necessary for extending the distance of optical frequency transfer, has significant impact on the transmission performance. In this paper, we propose a high gain optical injection locking amplifier (OILA) with low phase noise based on optical injection phase-locked loop for the phase-coherent optical frequency transmission. The high gain OILA can provide more than 75 dB gain and ensure that the input carrier frequency fractional stability can reach 8.2 × 10-20 at an averaging time of over 100 s. We then transfer a commercial narrow-linewidth laser over 220 km fiber link with only one amplification step placed at the remote end. After eliminating the noise induced in fiber link, the fractional frequency instability of transferred frequency can reach 9.0 × 10?16 at 1 s and 7.1 × 10?20 at 20000 s.
关键词： Laser injection-locked,Optical standards and testing.,Metrology,Diode lasers
更新于2025-09-23 15:22:29
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Electrical characterization of single nanometer-wide Si fins in dense arrays
摘要： This paper demonstrates the development of a methodology using the micro four-point probe (μ4PP) technique to electrically characterize single nanometer-wide fins arranged in dense arrays. We show that through the concept of carefully controlling the electrical contact formation process, the electrical measurement can be confined to one individual fin although the used measurement electrodes physically contact more than one fin. We demonstrate that we can precisely measure the resistance of individual ca. 20 nm wide fins and that we can correlate the measured variations in fin resistance with variations in their nanometric width. Due to the demonstrated high precision of the technique, this opens the prospect for the use of μ4PP in electrical critical dimension metrology.
关键词： micro four-point probe,electrical characterization,finFET,sheet resistance,critical dimension metrology
更新于2025-09-23 15:22:29
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Frequency Extension of Atomic Measurement of Microwave Strength Using Zeeman Effect
摘要： Measuring the field strength of an electromagnetic wave based on atomic quantum mechanics is expected to be an innovative method to realize stable and reliable measurements. However, the major issue of atomic measurements is that the measurable frequency is limited to the resonant frequency of atoms. Therefore, in this paper, we demonstrate the measurement at arbitrary frequencies using the Zeeman effect in a static magnetic field. A cesium vapor cell is placed in a static magnetic field of approximately 40 mT, which causes the resonant frequency of the cesium atom to shift from 9.2 to 8.2 GHz. In addition, the Rabi frequency due to the interaction between cesium atoms and microwaves is measured at the frequency of 8.2 GHz in this experiment.
关键词： frequency measurement,microwave measurements,metrology,microwave spectroscopy,electromagnetic measurements,Atom optics,atomic measurements,measurement standards
更新于2025-09-23 15:22:29
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Case Study of Empirical Beam Hardening Correction Methods for Dimensional X-ray Computed Tomography Using a Dedicated Multi-material Reference Standard
摘要： This paper presents a case study of two selected beam hardening correction methods and their effects on dimensional measurements of multi-material objects. The methods under test are empirical cupping correction (ECC) and empirical dual energy calibration (EDEC). These methods were originally developed for medical applications and their potential for the reduction of artefacts is typically only analysed based on grey value images. For testing and benchmarking of the mentioned methods for dimensional metrology, a dedicated multi-material reference standard—a multi-material hole cube—is used. This reference standard was originally developed for acceptance testing of CT systems. This paper shows a second application of this standard. The reference standard has been calibrated by tactile measurements to assess centre–centre distance errors as well as patch-based bidirectional length measurement errors on beam hardening corrected data and on uncorrected data. For the application of the method also to industrial multi-material scenarios, slight modifications of the ECC method are proposed. Practical aspects of both the ECC and the EDEC approaches as well as measurement results are analysed and discussed in detail. ECC was able to significantly improve dimensional measurements and was especially able to reduce extreme errors occurring in particular in multi-material scenarios by a factor of more than 4. EDEC, the dual-energy approach, reduced grey value inhomogeneities caused by artefacts even more. Its performance for dimensional measurements was however a little worse than ECC. EDEC data resulted in a slightly larger total range of residual measurement errors, mainly due to an elevated noise level.
关键词： Beam hardening correction,Industrial computed tomography,Multi-material measurements,Material influence,Dimensional metrology
更新于2025-09-23 15:22:29