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Structural studies of thin Mg films
摘要： In the present work variable energy positron annihilation spectroscopy (VEPAS) was employed for investigation of defects in Mg films. VEPAS characterization was combined with scanning electron microscopy and X-ray diffraction in order to determine grain size and texture respectively. The aim of this study was to examine the effect of deposition temperature and various substrates on structure and defects in Mg films prepared by RF magnetron sputtering. SEM observations revealed that films deposited on sapphire (0001) substrate exhibit always smaller grains than films deposited on amorphous fused silica and silicon (100) substrates, which have comparable grain size. Defect studies by VEPAS showed that positrons in Mg films studied are trapped at misfit dislocations and at vacancy-like defects in grain boundaries. Moreover, the films deposited on a substrate heated at 300?C exhibited lower concentration of defects and larger grain size compared to the films deposited at room temperature. Subsequent annealing at 300?C for 1 h of the films deposited at room temperature causes a slight decrease of defect density due to coarsening of grains.
关键词： SEM,Mg films,VEPAS,grain size,defects,XRD
更新于2025-09-11 14:15:04
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Preparation and Characterization of Copper Doped Cd0.7Zn0.3S Thin Film and Evaluation of Doping Effect of Copper
摘要： Cd0.7Zn0.3S was doped for different mol % of Cu was prepared by chemically deposited technique. The film has been characterized by X-ray diffraction, scanning electron microscope, energy dispersive spectroscopy and ultra violet spectroscopy. The result of X-ray diffraction showed that the films are polycrystalline in nature with a hexagonal structure. SEM studies revealed the size of the sphere increases initially with the increase in Cu concentration. The presence of elemental constituent has been confirmed by energy dispersive X-ray analysis. Results obtained from optical studies showed that the band gap energy varied from 4.650 to 3.265 eV, which confirmed the decrease of band gap with increase in the concentration of Cu on Cd0.7Zn0.3S.
关键词： SEM,Copper,Chemical bath deposition,Thin film,XRD
更新于2025-09-10 09:29:36
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AIP Conference Proceedings [Author(s) INTERNATIONAL CONFERENCE ON INVENTIVE MATERIAL SCIENCE APPLICATIONS: ICIMA-2018 - Tamil Nadu, India (27–28 September 2018)] - The effect of the ZnO thickness layer on the porous silicon properties deposited by chemical vapor deposition
摘要： We report on the properties of porous silicon deposited by Electro-Chemical Etching (ECE) technique with ZnO nanoparticles layer grown on porous silicon (P-type) by Chemical Vapor Deposition (CVD). X-ray diffraction study on the crystallographic structure revealed a beneficial impact of ZnO films on the structural properties of the porous silicon. Moreover, these properties enhanced when the ZnO layer thickness was increased. The morphological properties of ZnO/PSi were investigated based on Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) measurements. The results indicate an upgrading in the structural stability of PSi substrate with crystalline growth of ZnO thin film. It is also observed that the value of the roughness (RMS) increases when ZnO filme on PSi increases. All these results indicate that the interested ZnO shows a good and homogenous layer using (CVD) technique. Finally, it is evident that porous silicon substrate can open the door for improving the crystalline quality in hexagonal lattice of ZnO thin film, and this could be due to sponge-like structure of porous silicon.
关键词： ZnO,porous silicon,SEM,Chemical Vapor Deposition,AFM,Electro-Chemical Etching,XRD
更新于2025-09-10 09:29:36
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European Microscopy Congress 2016: Proceedings || Imaging of Electric Fields with the pnCCD (S)TEM Camera
摘要： The imaging of electric fields with the pnCCD (S)EM camera allows for the fast, direct, and precise measurement of electric fields in various materials. Techniques providing fast, direct, and precise measurement of the electric field distribution are of great interest for modern materials research. We present a fast, direct, and precise measurement of the electric field distribution in the nanometer scale with the pnCCD (S)EM camera. With this technique, small shifts of the bright field image due to the electric field can be detected with a precision of less than 1 nm. The large number of pixels (264 × 264) allows for the simultaneous measurement of the electric field in a large area. The fast readout (1.2 kHz) enables the observation of dynamic processes. The direct measurement of the electric field avoids the need for complex simulations or indirect methods. The pnCCD (S)EM camera is thus a powerful tool for the investigation of electric fields in materials.
关键词： SEM,electric field,imaging,pnCCD,nanometer scale
更新于2025-09-10 09:29:36
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Determination of Sulfite in Botanical Medicine Using Headspace Thin-Film Microextraction and Surface Enhanced Raman Spectrometry
摘要： A facile method using headspace thin-film microextraction (HS-TFME) coupled with surface enhanced Raman spectrometry (SERS) has been developed for the determination of sulfite in traditional Chinese herbal medicine. The extraction substrate was synthesized by depositing urchin-like ZnO micron particles on glass sheets using chemical liquid phase deposition. Under the optimal conditions, the intensity of the SERS signal at 630–640 cm?1 provided a good linear relationship with the concentration of sulfite from 25 to 400 mg/kg, and the linear correlation coefficient (R) was 0.996 with a detection limit of 6 mg/kg. The method was employed for the determination of sulfite in herbal medicines, and the results were confirmed by a traditional distillation-titration method. Therefore, this developed HS-TFME-SERS method may play an important role in the rapid, simple, and selective determination of sulfite residues in Chinese herbal medicine and become a potentially universal method for this analyte in various solid samples.
关键词： Headspace thin-film microextraction (HS-TFME),scanning electron microscopy (SEM),X-ray diffraction (XRD),surface enhanced Raman spectrometry (SERS),transmission electron microscopy (TEM)
更新于2025-09-10 09:29:36
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The 3D imaging of mesenchymal stem cells on porous scaffolds using high-contrasted x-ray computed nanotomography
摘要： This study presents an X-ray computed nanotomography (nano-CT) based, high-resolution imaging technique. Thanks to a voxel resolution of 540 nm, this novel technique is suitable for observing the 3D morphology of soft biopolymeric scaffolds seeded with stem cells. A sample of highly porous collagen scaffold seeded with contrasted mesenchymal stem cells (MSC) was investigated by using lab-based nano-CT. The whole volume of the sample was analysed without its destruction. To evaluate the potential of nano-CT, a comparison measurement was done using a standard microscopy technique. Scanning electron microscopy (SEM) combined with energy dispersive X-ray analysis (EDX) established an extension and local accumulation of the contrasting agent – heavy metallic osmium tetroxide. The presented imaging technique is novel as it will help to understand better the behaviour of cells while interacting with three-dimensional biomaterials. This is crucial for both experimental and clinical tissue engineering applications in order to limit the risk of uncontrolled cell growth, and potentially tumour formation.
关键词： SEM/EDX,X-ray computed nanotomography,mesenchymal stem cells,tissue engineering,Biopolymeric scaffold
更新于2025-09-10 09:29:36
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PHYTOSYNTHESIS OF SILVER NANOPARTICLES USING E. CAMALDULENSIS LEAF EXTRACT AND THEIR CHARACTERIZATION
摘要： Herein, we report a simple green synthesis of silver nanoparticles (Ag NPs) by the reduction of aqueous silver salt solution using leaf broth of Eucalyptus camaldulensis. The profile of synthesized silver nanoparticles was evaluated by using UV-visible spectrophotometer, X-ray diffractometer, atomic force microscope, energy-dispersive X-ray spectroscope and scanning electron microscope. Surface plasmon resonance peak of silver nanoparticles appeared at 425 nm in UV-vis spectra of silver nanoparticles. XRD studies clearly confirmed the crystalline nature of the synthesized nanoparticles. The EDX analysis disclosed the arranged inorganic composition of the synthesized Ag NPs. Atomic force microscopy investigation revealed 3D surface profile of nanoparticles. From the SEM images, the silver nanoparticles were found to be more or less spherical with an average diameter range of 110-250 nanometers.
关键词： E. camaldulensis,SEM,AFM,UV-visible spectrophotometry,XRD,Ag NPs
更新于2025-09-10 09:29:36
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From EBIC images to qualitative minority carrier diffusion length maps
摘要： A novel method is presented with the aim to perform minority carrier di?usion length map on cross-sectional samples. The method is based on one Electron-Beam Induced Current (EBIC) acquisition and on the analyze of the EBIC signal slope variation on each scanned points. This method is applied on a pinned photodiode array realized on a low doped silicon epitaxy, and the electron di?usion length map which is extracted is in good accordance with our expectation taking into account the doping distribution of the device. A TCAD simulation also con?rms quantitatively the measured di?usion length map. Advantages and drawbacks of this method are discussed in this study.
关键词： CMOS image sensors,CMOS,Scanning electron microscopy (SEM),Simulation,Electron-beam-induced current (EBIC),Deep submicron process,Solid-state image sensor,Semiconductor material measurements
更新于2025-09-10 09:29:36
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Synthesis, characterisation, and antimicrobial activity of ZnO-based nanocomposites
摘要： In this study, ZnO-based nanocomposites including ZnO/CuO (S1), ZnO/MnO (S2), and ZnO/MnO/CuO (S3), were synthesised. S1, S2, and S3 were characterised through Fourier transform infrared (FTIR), X-ray diffraction (XRD), scanning electron microscopy (SEM), and energy dispersive X-ray spectroscopy (EDS) techniques. Also, the antimicrobial property of the samples was examined against both Gram-positive Staphylococcus aureus and Gram-negative Escherichia coli through the colony forming count method. FTIR analysis confirmed the presence of Zn–O, Mn–O, and Cu–O in the samples. The crystalline structure of the sample was analysed by XRD. The surface morphology of the prepared compounds was studied with SEM images. EDS technique was employed for ensuring the presence of Zn, Mn, and Cu elements in the samples. The results clearly showed S1, S2, and S3 had high-antimicrobial activity especially for S3.
关键词： SEM,EDS,FTIR,XRD,antimicrobial activity,ZnO-based nanocomposites
更新于2025-09-10 09:29:36
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Unbiased roughness measurements: Subtracting out SEM effects, part 2
摘要： The measurement of roughness of small lithographic patterns is biased by noise in the scanning electron microscopes (SEMs) used to make the measurements. Unbiasing the roughness measurement requires the measurement and subtraction of the image noise based on its unique frequency behavior. Improvement to prior white noise removal is achieved by applying a pink noise model. This pink noise removal technique was applied to roughness measurements made with different electron doses (frames of integration), different operating voltages, and different generations of SEM tools. Effective noise removal to create accurate unbiased estimates of the roughness was achieved over a wider range of SEM tool parameter settings than has been previously achieved. As a result, unbiased roughness measurements can now be used to characterize and improve stochastic variability in semiconductor lithography and patterning.
关键词： SEM effects,pink noise model,roughness measurements,electron doses,SEM tools,operating voltages
更新于2025-09-09 09:28:46