[IEEE 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED) - Toulouse, France (2019.8.27-2019.8.30)] 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED) - Parametric degradation model of OLED using Design of Experiments (DoE)

摘要： This article presents an original parametric degradation model using Design of Experiments. This method is based on the estimation of a Weibull function under accelerated conditions. It is applied on cold white organic light emitting diodes OLEDs from Philips with a 10000 hrs theoretical lifetime. Accelerated degradation using thermal and electrical stress is tested. The predicted degrading model is a function of time, temperature, current density and their interaction. It illustrates the behaviour of the degradation of the OLED using multiple stress factors without really knowing the physics of these degradations. The proposed model is tested on experimental data for different luminances. The average error of the predicted model compared to real values is around 3 %. The proposed model is then compared to a previously developed lifespan model. The results obtained with the present approach are closer to the real values.