- 标题
- 摘要
- 关键词
- 实验方案
- 产品
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[IEEE 2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Raleigh, NC, USA (2019.10.29-2019.10.31)] 2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Detailed Study of Breakdown Voltage and Critical Field in Wide Bandgap Semiconductors
摘要： We systematically study the analysis and simulation of ac-biased superconductor transition-edge sensor (TES) circuits. In these ac-biased circuits, the current and voltage of the TES experience large swings in both directions, and small-signal analysis around a dc steady state does not apply. To understand their electrical and thermal behavior, we rely on concepts and techniques from radio-frequency circuit simulation and introduce the periodic steady state and perform periodic ac analysis. We also construct TES device models based on a comprehensive two-fluid physical model and investigate the behavior of ac-biased TES circuits using advanced circuit simulators. By relating our findings to results for the analysis of dc-biased TES circuits, we give appropriate definitions for the current and temperature sensitivity of the TES in ac-biased circuits. Our work not only builds a rigorous foundation for theoretical analysis of ac-biased TES circuits but also introduces powerful simulation techniques valuable for their design and research.
关键词： Circuit analysis,computer simulation,superconducting devices
更新于2025-09-23 15:21:01
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[IEEE 2019 Compound Semiconductor Week (CSW) - Nara, Japan (2019.5.19-2019.5.23)] 2019 Compound Semiconductor Week (CSW) - Room-Temperature Electrically Pumped InP-based $1.3\boldsymbol{\mu} \mathbf{m}$ Quantum Dot Laser on on-axis (001) Silicon
摘要： We present a method for quantifying a risk for killer defects at layer level and estimating yield for substrate packages using information from design ?les. To calculate risk ranks and predicted yield, we de?ne a risk distance that is a key parameter extracted from designs using image processing techniques. In order to validate our model, we analyze two different designs, each having multiple layers, and compare with data from baseline lots. It is shown that there is an inverse correlation between risk layer ranks and yield. Estimated yield based on our model is compared with baseline yield for four layers of the second design. The model-to-baseline yield difference is less than 1% for three layers we tested.
关键词： yield estimation,assembly,circuit analysis,metrology sampling,Yield prediction,integrated circuit packaging
更新于2025-09-23 15:19:57
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[IEEE 2019 Compound Semiconductor Week (CSW) - Nara, Japan (2019.5.19-2019.5.23)] 2019 Compound Semiconductor Week (CSW) - Effect of Annealing on The Bottom Cell in GaInP/GaAs/GaInNAsSb Triple Junction Solar Cells by MBE/MOCVD Hybrid Growth
摘要： We present a method for quantifying a risk for killer defects at layer level and estimating yield for substrate packages using information from design ?les. To calculate risk ranks and predicted yield, we de?ne a risk distance that is a key parameter extracted from designs using image processing techniques. In order to validate our model, we analyze two different designs, each having multiple layers, and compare with data from baseline lots. It is shown that there is an inverse correlation between risk layer ranks and yield. Estimated yield based on our model is compared with baseline yield for four layers of the second design. The model-to-baseline yield difference is less than 1% for three layers we tested.
关键词： yield estimation,assembly,circuit analysis,metrology sampling,Yield prediction,integrated circuit packaging
更新于2025-09-23 15:19:57
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[IEEE 2019 IEEE Sustainable Power and Energy Conference (iSPEC) - Beijing, China (2019.11.21-2019.11.23)] 2019 IEEE Sustainable Power and Energy Conference (iSPEC) - Three-phase Power Flow Model of Low-voltage Distribution Network Considering Phase Asymmetry and Photovoltaic Access
摘要： We systematically study the analysis and simulation of ac-biased superconductor transition-edge sensor (TES) circuits. In these ac-biased circuits, the current and voltage of the TES experience large swings in both directions, and small-signal analysis around a dc steady state does not apply. To understand their electrical and thermal behavior, we rely on concepts and techniques from radio-frequency circuit simulation and introduce the periodic steady state and perform periodic ac analysis. We also construct TES device models based on a comprehensive two-fluid physical model and investigate the behavior of ac-biased TES circuits using advanced circuit simulators. By relating our findings to results for the analysis of dc-biased TES circuits, we give appropriate definitions for the current and temperature sensitivity of the TES in ac-biased circuits. Our work not only builds a rigorous foundation for theoretical analysis of ac-biased TES circuits but also introduces powerful simulation techniques valuable for their design and research.
关键词： Circuit analysis,computer simulation,superconducting devices
更新于2025-09-23 15:19:57
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[IEEE 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) - Chicago, IL, USA (2019.6.16-2019.6.21)] 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) - Distribution Feeder Fault Comparison Utilizing a Real-Time Power Hardware-in-the-Loop Approach for Photovoltaic System Applications
摘要： Power outages are a challenge that utility companies must face, with the potential to affect millions of customers and cost billions in damage. For this reason, there is a need for developing approaches that help understand the effects of fault conditions on the power grid. In distribution circuits with high renewable penetrations, the fault currents from DER equipment can impact coordinated protection scheme implementations so it is critical to accurately analyze fault contributions from DER systems. To do this, MATLAB/Simulink/RT-Labs was used to simulate the reduced-order distribution system and three different faults are applied at three different bus locations in the distribution system. The use of Real-Time (RT) Power Hardware-in-the-Loop (PHIL) simulations was also used to further improve the fidelity of the model. A comparison between OpenDSS simulation results and the Opal-RT experimental fault currents was conducted to determine the steady-state and dynamic accuracy of each method as well as the response of using simulated and hardware PV inverters. It was found that all methods were closely correlated in steady-state, but the transient response of the inverter was difficult to capture with a PV model and the physical device behavior could not be represented completely without incorporating it through PHIL.
关键词： faults,photovoltaic inverter,short-circuit analysis,hardware-in-the-loop
更新于2025-09-23 15:19:57
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[IEEE 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) - Chicago, IL, USA (2019.6.16-2019.6.21)] 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) - The Luminescent Down Shifting Effect of Single-Junction GaAs Solar Cell with Perovskite Quantum Dots
摘要： We present a method for quantifying a risk for killer defects at layer level and estimating yield for substrate packages using information from design ?les. To calculate risk ranks and predicted yield, we de?ne a risk distance that is a key parameter extracted from designs using image processing techniques. In order to validate our model, we analyze two different designs, each having multiple layers, and compare with data from baseline lots. It is shown that there is an inverse correlation between risk layer ranks and yield. Estimated yield based on our model is compared with baseline yield for four layers of the second design. The model-to-baseline yield difference is less than 1% for three layers we tested.
关键词： metrology sampling,circuit analysis,assembly,yield estimation,integrated circuit packaging,Yield prediction
更新于2025-09-19 17:13:59
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[IEEE 2019 International Conference on Electrical and Computing Technologies and Applications (ICECTA) - Ras Al Khaimah, United Arab Emirates (2019.11.19-2019.11.21)] 2019 International Conference on Electrical and Computing Technologies and Applications (ICECTA) - Residential Photovoltaic Systems Design for Countries with Planned Regular Outages
摘要： We systematically study the analysis and simulation of ac-biased superconductor transition-edge sensor (TES) circuits. In these ac-biased circuits, the current and voltage of the TES experience large swings in both directions, and small-signal analysis around a dc steady state does not apply. To understand their electrical and thermal behavior, we rely on concepts and techniques from radio-frequency circuit simulation and introduce the periodic steady state and perform periodic ac analysis. We also construct TES device models based on a comprehensive two-?uid physical model and investigate the behavior of ac-biased TES circuits using advanced circuit simulators. By relating our ?ndings to results for the analysis of dc-biased TES circuits, we give appropriate de?nitions for the current and temperature sensitivity of the TES in ac-biased circuits. Our work not only builds a rigorous foundation for theoretical analysis of ac-biased TES circuits but also introduces powerful simulation techniques valuable for their design and research.
关键词： superconducting devices,computer simulation,Circuit analysis
更新于2025-09-19 17:13:59
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[IEEE 2019 IEEE Pulsed Power & Plasma Science (PPPS) - Orlando, FL, USA (2019.6.23-2019.6.29)] 2019 IEEE Pulsed Power & Plasma Science (PPPS) - Wide Bandgap Photoconductive Switches Driven by Laser Diodes as a High-Voltage Mosfet Replacement for Bioelectrics and Accelerator Applications
摘要： We systematically study the analysis and simulation of ac-biased superconductor transition-edge sensor (TES) circuits. In these ac-biased circuits, the current and voltage of the TES experience large swings in both directions, and small-signal analysis around a dc steady state does not apply. To understand their electrical and thermal behavior, we rely on concepts and techniques from radio-frequency circuit simulation and introduce the periodic steady state and perform periodic ac analysis. We also construct TES device models based on a comprehensive two-?uid physical model and investigate the behavior of ac-biased TES circuits using advanced circuit simulators. By relating our ?ndings to results for the analysis of dc-biased TES circuits, we give appropriate de?nitions for the current and temperature sensitivity of the TES in ac-biased circuits. Our work not only builds a rigorous foundation for theoretical analysis of ac-biased TES circuits but also introduces powerful simulation techniques valuable for their design and research.
关键词： Circuit analysis,computer simulation,superconducting devices
更新于2025-09-19 17:13:59
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A MPPT Method based on Improved Fibonacci Search Photovoltaic Array
摘要： The P-U curve of photovoltaic arrays (PVAs) has multi-peak characteristics under uneven illumination environments, and the maximum power point tracking (MPPT) strategy for the single peak may fail. An improved Fibonacci search algorithm is proposed to carry out MPPT of photovoltaic arrays under uniform illumination or light mutation. A multiple-interval search algorithm based on a circuit analysis method is presented for different topology arrays and illumination distributions. The series array analysis adopts the current analysis method, the parallel array analysis adopts the voltage analysis method, and the series and parallel array analysis adopts the current and voltage analysis method; then, the output control volume is determined, and the search interval is divided. The search steps in the Fibonacci method and the real-time changes of parameters in the optimization process can be observed by MATLAB simulation. Experimental results show that the algorithm uses less computation time and small area search instead of global search.
关键词： Fibonacci search,MATLAB simulation,photovoltaic array,circuit analysis method,maximum power point tracking
更新于2025-09-16 10:30:52
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[IEEE 2018 53rd International Universities Power Engineering Conference (UPEC) - Glasgow, United Kingdom (2018.9.4-2018.9.7)] 2018 53rd International Universities Power Engineering Conference (UPEC) - Manage Reverse Power Flow and Fault Current Level in LV Network with High Penetration of Small Scale Solar and Wind Power Generation
摘要： High penetration level of rooftop small-scale renewable energy generation (REG) such as solar and wind power into the existing low voltage (LV) network would cause the flow of power in reverse direction. This would also vary the level of short-circuit current required for relays to operate. Relay settings would be required to properly detect the unpredictable isolate the faulty section. This paper investigates the impact of residential distributed generation (DG) penetration level on the typical UK low voltage network protection system. Studies were commenced to properly charge and discharge the home connected energy storage battery (ESB). ESB is used as a remedial measure to confine the flow of reverse power due to rooftop DGs. Penetration level DGs are modeled based on proper ESB charging and discharging states in daily load cycle. Short circuit analysis results are compared with the UK passive network to investigate the impact of the DG on the short circuit currents at distribution transformer.
关键词： UK distribution network,short circuit analysis,Rooftop DG penetration,energy storage batteries,reverse power flow
更新于2025-09-04 15:30:14