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oe1(光电查) - 科学论文

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  • 55.1: <i>Invited Paper:</i> Achieving high uniformity of 200 mm GaN‐on‐Si LED epiwafers for micro LED applications

    摘要: One of the big challenges of micro LED displays is to reduce cost/increase yield and establish excellent manufacturability. Galliumnitride on silicon (GaN-on-Si) LED epiwafers offer fundamental cost advantages to the entire process flow for micro LEDs compared with conventional GaN-on-sapphire LED epiwafers. However, due to the difficulties of epitaxial growth of GaN-on-Si, demonstration of such cost advantages in micro LED application is not wide-spread yet. In this presentation, we have demonstrated excellent emission uniformity with well- controlled strain by precise strain-engineering. This opens the way to use the advantages of GaN-on-Si LED epiwafers in the entire supply chain of micro LED making and thus reduce cost significantly and enable high yield manufacturing.

    关键词: curvature,GaN-on-Si,200 mm epiwafer,reproducibility,micro LED,emission wavelength uniformity,strain-engineering

    更新于2025-09-11 14:15:04