- 标题
- 摘要
- 关键词
- 实验方案
- 产品
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Air-Filled Substrate Integrated Waveguide Leaky-Wave Antenna with Wideband and Fixed-Beam Characteristics
摘要： An output line-to-line voltage model-based fault diagnostic technique is presented in this paper. From the theoretical analysis of the output voltage under normal and faulty conditions, a preprocessing method is developed to extract fault features from diagnosis eigenvalue. A voltage envelope line is generated by the proposed voltage envelope function. By comparing the preprocessed diagnosis eigenvalue and the voltage envelope, single-switch open-circuit faults can be located precisely. Because the proposed method does not rely on the accurate amplitude of the output line-to-line voltage, the influence of the load changing is minimized and simple hardware is adopted, which has advantages of low cost, high reliability, and short diagnosis time. Moreover, as long as the inverter output voltages have the feature of periodic nonpositive and nonnegative, this method is valid no matter what control strategy is adopted by the inverter and no control signal is required for the diagnosis process. The prototype system is tested to validate the adaptability of the proposed method under different conditions, such as the diverse loads, various control strategies, and fault-occurrence time.
关键词： Fault diagnosis,fault location,open-circuit fault,inverters
更新于2025-09-19 17:13:59
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[IEEE 2019 21st International Conference on Transparent Optical Networks (ICTON) - Angers, France (2019.7.9-2019.7.13)] 2019 21st International Conference on Transparent Optical Networks (ICTON) - Plasmonic Waveguides Co-Integrated with Si <sub/>3</sub> N <sub/>4</sub> Waveguide Platform for Integrated Biosensors
摘要： This paper presents a placement algorithm for fault location observability using phasor measurement units (PMUs) in the presence or absence of zero injection buses. The problem is formulated as a binary semidefinite programming (BSDP) model with binary decision variables, minimizing a linear objective function subject to linear matrix inequality (LMI) observability constraints. The model is extended to take into account the unavailability or limited capacity of communication links at some PMU installation buses. The BSDP problem is solved using an outer approximation scheme based on binary integer linear programming. The method is illustrated with a 6-bus test system. Numerical simulations are conducted on the IEEE 14-, 30-, and 57-bus standard test systems to verify the effectiveness of the proposed method.
关键词： semidefinite programming,phasor measurement unit,linear matrix inequality,Fault location observability,synchronized phasor measurements
更新于2025-09-19 17:13:59
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[IEEE 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) - Chicago, IL, USA (2019.6.16-2019.6.21)] 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) - Open-source integrated optical modelling with RayFlare
摘要： An output line-to-line voltage model-based fault diagnostic technique is presented in this paper. From the theoretical analysis of the output voltage under normal and faulty conditions, a preprocessing method is developed to extract fault features from diagnosis eigenvalue. A voltage envelope line is generated by the proposed voltage envelope function. By comparing the preprocessed diagnosis eigenvalue and the voltage envelope, single-switch open-circuit faults can be located precisely. Because the proposed method does not rely on the accurate amplitude of the output line-to-line voltage, the influence of the load changing is minimized and simple hardware is adopted, which has advantages of low cost, high reliability, and short diagnosis time. Moreover, as long as the inverter output voltages have the feature of periodic nonpositive and nonnegative, this method is valid no matter what control strategy is adopted by the inverter and no control signal is required for the diagnosis process. The prototype system is tested to validate the adaptability of the proposed method under different conditions, such as the diverse loads, various control strategies, and fault-occurrence time.
关键词： Fault diagnosis,fault location,open-circuit fault,inverters
更新于2025-09-16 10:30:52
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[IEEE 2019 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto, Japan (2019.11.14-2019.11.15)] 2019 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Invited: Possibility of dye-sensitized solar cell as energy harvester
摘要： This paper proposes a statistical approach for section-based fault location in medium voltage (MV) grids with underground cables, using Bayesian inference. The proposed approach considers several important uncertainties in the MV grid, including measurement errors, fault breakdown resistance, and the inaccuracies of zero-sequence parameters. The approach first obtains the prior distribution of the fault position from the component failure database, the readings of the transmitted fault indicators, and the relevant digging activity record. With the estimated prefault grid status and the measured transient voltages/currents, the posterior distribution is then calculated based on Bayes’ theorem. To solve the problem numerically, the Monte Carlo integration is applied and a two-step calculation procedure is proposed. Simulations are performed on a typical European MV feeder to demonstrate the feasibility of the approach. The distribution grid operators can use the calculated posterior distribution to rank the possible faulted sections and to facilitate the restoration process, which can reduce the interruption duration of power supply.
关键词： transient measurements,section-based fault location,Monte Carlo integration,underground cables,Bayesian inference
更新于2025-09-16 10:30:52
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Detection of abnormality occurring over the whole cable length by frequency domain reflectometry
摘要： In previous papers, the authors reported that a combination of frequency domain reflectometry and inverse fast Fourier transform can locate the position of occurrence of degradation or abnormality in a polymer-insulated electric cable. This paper demonstrates that this method is also applicable even if the degradation or abnormality occurs uniformly over the entire cable length.
关键词： frequency domain reflectometry,broadband impedance spectroscopy,fault location,characteristic impedance,aging
更新于2025-09-04 15:30:14