[IEEE 2018 International Conference on Electromagnetics in Advanced Applications (ICEAA) - Cartagena des Indias (2018.9.10-2018.9.14)] 2018 International Conference on Electromagnetics in Advanced Applications (ICEAA) - Two-parameter expansions and ray representation of the fields diffracted at thin-to-thick curved dielectric layers and conducting bodies

摘要： In this study, we introduce a uni?ed approach that allows to construct the asymptotic procedure for various high-frequency electromagnetic diffraction problems at curved dielectric, conducting, and absorbing layers, and to obtain the curvature correction to solutions. The method proposed is based on the combination of ray representations and the expansions typical for the boundary-layer technique: we seek the ?eld as a ray series, whose coef?cients are the functions of a point in space, the more “stretched” along the normal to one of the boundaries, the thicker layer is. The asymptotics are derived both in 2D and 3D formulations and are validated by comparison with analytical and numerical solutions of canonical problems.