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- 实验方案
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In-Line Holography in Transmission Electron Microscopy for the Atomic Resolution Imaging of Single Particle of Radiation-Sensitive Matter
摘要： In this paper, for the first time it is shown how in-line holography in Transmission Electron Microscopy (TEM) enables the study of radiation-sensitive nanoparticles of organic and inorganic materials providing high-contrast holograms of single nanoparticles, while illuminating specimens with a density of current as low as 1–2 e???2s?1. This provides a powerful method for true single-particle atomic resolution imaging and opens up new perspectives for the study of soft matter in biology and materials science. The approach is not limited to a particular class of TEM specimens, such as homogenous samples or samples specially designed for a particular TEM experiment, but has better application in the study of those specimens with differences in shape, chemical composition, crystallography, and orientation, which cannot be currently addressed at atomic resolution.
关键词： TEM,radiation damage,atomic resolution imaging,nanostructured drugs,organic materials,in-line holography,soft matter,single particle imaging
更新于2025-09-23 15:19:57
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[IEEE 2019 IEEE Research and Applications of Photonics in Defense Conference (RAPID) - Miramar Beach, FL, USA (2019.8.19-2019.8.21)] 2019 IEEE Research and Applications of Photonics in Defense Conference (RAPID) - Laser Diagnostics for Solid Rocket Propellants and Explosives
摘要： Laser diagnostics are essential for time-resolved studies of solid rocket propellant combustion and small explosive detonations. Digital in-line holography (DIH) is a powerful tool for three-dimensional particle tracking in multiphase flows. By combining DIH with complementary diagnostics, particle temperatures and soot/smoke properties can be identified.
关键词： digital in-line holography,solid rocket propellants,imaging pyrometry,explosives,phase-conjugate digital in-line holography,time-resolved laser-induced incandescence
更新于2025-09-12 10:27:22
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European Microscopy Congress 2016: Proceedings || Using a simplified in line holography method as a qualitative tool to detect local heterogeneities in HfO2 layers
摘要： Oxygen vacancies in high-k oxides are foreseen to have detrimental effects in devices like high-k metal gate MOS transistors [1] and beneficial ones in RRAM [2]. In this context techniques capable to characterize defects in ultra-thin (2 thin films and revealed the impact of the grain nanostructure on the electronic structures [4]. When traversing the sample electron waves experience a phase shift related to the local inner potential created by atoms. The reference technique to retrieve this phase shift is off axis electron holography. However as it is a delicate technique, the alternative in line holography based on the acquisition of a focal series can be of interest. The advantage of in line holography is to be easy to carry out in the course of a classical TEM study and to provide phase image on a large scale (up to several microns). The present work aims at examining the capabilities of a simplified approach of in line electron holography to evidence heterogeneities in a polycrystalline HfO2 layer.
关键词： oxide,defect,in line holography,phase retrieval
更新于2025-09-11 14:15:04