A Beginners' Guide to Scanning Electron Microscopy || Imaging with the SEM

摘要： The scanning electron microscope is routinely used to characterize wide-ranging materials due to its ease of operation and relatively straightforward sample preparation as well as due to simple image interpretation. New users can readily obtain images after little practice. However, high-resolution microscopy and examination of “difficult” samples require experience and know-how of the principles of image formation in the SEM. This chapter describes the role of various operational parameters used during microscopy in more detail. The effect of these parameters on contrast, resolution, and depth of field depicted by images is discussed. Pros and cons of microscopy conditions that have a direct bearing on the quality of images, type of information obtained, and image interpretation are elaborated. Guidelines for operation and upkeep of the SEM instrument are also summarized in this chapter.