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[IEEE 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Paris, France (2018.7.8-2018.7.13)] 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards
摘要: Methods for traceable characterization and uncertainty evaluation of planar 1-port CPW short-open-load (SOL) devices are developed. The agreement of modelling and verification measurement results greatly supports the application of the proposed parameterization models and used FEM-based EM modelling of CPW structures for traceable characterization of planar CPW-based SOL devices in the frequency range between a few kHz up to 50 GHz.
关键词: traceability,co-planar waveguide,measurement uncertainty,VNA,nanostructures,on-wafer calibration,EM simulation,precision measurements
更新于2025-09-10 09:29:36