Noise mitigation methods for ion detectors operating with a direct view of high temperature plasmas

摘要： We have developed an ion current measurement instrument with a direct view of a plasma that reduces the particle and radiation-induced noise current it detects by over three orders of magnitude, from tens of microamps to tens of nanoamps. This is accomplished using electric ?elds, magnetic ?elds, and physical shielding that limit the ?ux of particles and radiation into the instrument and suppress the secondary electrons produced within it by particle and radiation impact. Operation of this detector in various con?gurations, without an ion beam, has allowed identi?cation of the sources of noise current. In our experimental setup, the largest noise contributors were found to be plasma ions and photoelectric emission due to UV radiation.