[IEEE 2019 Silicon Nanoelectronics Workshop (SNW) - Kyoto, Japan (2019.6.9-2019.6.10)] 2019 Silicon Nanoelectronics Workshop (SNW) - Error Crrection for Read-hot Data in 3D-TLC NAND Flash by Read-disturb Modeled Artificial Neural Network Coupled LDPC ECC

摘要： Read-disturb Modeled Artificial Neural Network Coupled LDPC ECC (RDNN-LDPC) is proposed to correct errors of read-hot data for 3D-TLC NAND flash. Conventional ANN-LDPC is optimized to correct errors of read-cold data. However, ANN-LDPC does not correct errors of read-hot data. To correct errors of read-hot data, this paper analyzes how input parameter and model change. As a result, measured results of proposed RDNN-LDPC extend acceptable read cycle of 3D-TLC NAND flash by 10-times.