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Improved Retention Performance in Graphene-Ferroelectric Memory Device Through Mitigation of the Surface Roughness of the Ferroelectric Layer
摘要： A ferroelectric-gated graphene field-effect transistor was fabricated with a bottom-gate structure. A ferroelectric gate dielectric was formed using the spin-coating method. Two samples were made, one with a single coating and the other with a double coating. It was observed that the data retention times of the two samples were significantly different. When comparing the surface roughness, the surface of the thin film produced by the double coating was much flatter. Based on the observation of the surface morphology, an interfacial layer composed of air was deduced as the origin of both the depolarization and short retention time. That is, when fabricating the graphene-ferroelectric memory device, the importance of the interface treatment could be confirmed. Based on these results, it is expected that a much more reliable device can be realized through surface engineering via a graphene-ferroelectric device process.
关键词： Surface Roughness,Graphene,Ferroelectric,Interface
更新于2025-09-04 15:30:14
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Fabrication of high fill-factor aspheric microlens array by dose-modulated lithography and low temperature thermal reflow
摘要： A cost-effective fabrication method for high quality and high fill-factor aspheric microlens arrays (MLAs) is developed. In this method, the complex shape of aspheric microlens is pre-modeled via dose modulation in a digital micromirror device (DMD) based maskless projection lithography system. Digital masks for several bottom layers are replaced from circle to hexagon for the purpose of enhancing the fill-factor of MLAs, then a low temperature thermal reflow process is conducted, after which the average surface roughness of microlens is improved to * 0.427 nm while the pre-modeled profile keeps unchanged. Experimental results show that the fabricated aspheric MLAs have almost 100% fill-factor, high shape accuracy and high surface quality. The presented method may provide a promising approach for rapidly fabricating high quality and high fill-factor aspheric microlens in a simple and low-cost way.
关键词： high fill-factor,dose-modulated lithography,aspheric microlens arrays,surface roughness,low temperature thermal reflow
更新于2025-09-04 15:30:14
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Effect of substrate thickness on coating roughness Ti/AlTiN during interaction process Parameter
摘要： Ti/TiAlN coatings were deposited on tungsten carbide substrates and consist of the target Ti0.5Al0.5 using sputtering system is one of the main techniques which done be coating substrate. This research aimed is to develop the model a PVD magnetron sputtering process that can predict the relationship between process input parameters and the resulting coating properties and performance. RSM Response Surface Methodology was used, one of the most cost-effective and practical techniques to develop the process model. The influence of substrate thickness on the structural properties of the coatings was investigated and the effect of bias voltage on the microstructure was investigated. The number of crystallite grain size reduced with the increase of the bias voltage then reduce minimum roughness 0.07157 (μm) and became maximum roughness 0.7856 (μm). The crystalline grain size of the coatings increased as the bias voltage was raised from 50 to 75 V, and then decreased with further increase of the bias voltage.
关键词： interaction,PVD,Sputtering,surface roughness,RSM
更新于2025-09-04 15:30:14
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Correlation of Near Infrared Spectroscopy Measurements with the Surface Roughness of Wood
摘要： The surface roughness of Chinese fir and Eucalyptus wood samples were measured using the stylus profile method in order to investigate the correlation between near infrared (NIR) spectroscopy and surface roughness. The results showed that the NIR spectra absorption showed differences among samples from different surface roughnesses, and the absorption decreased with the increase of the surface roughness. A strong relationship was found between the surface roughness parameters, i.e., the arithmetical mean deviation of the profile (Ra), the ten-point height of irregularities (Rz), and the maximum height of profile (Ry). Based on the NIR spectra of the Chinese fir wood samples and the mixed wood samples of the two wood species, and the correlation coefficients of these two types of wood samples in a calibration set were 0.77 to 0.83 and 0.67 to 0.74, respectively. A relatively poor correlation was found in the model based on the Eucalyptus samples; however, it was still significant. These results suggested that there was relative information about the surface roughness from the NIR spectra, which further illustrated that the surface roughness may influence the effect of models for wood properties built by NIR data.
关键词： Near infrared spectroscopy,Correlation,Wood,Surface roughness
更新于2025-09-04 15:30:14