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Research on the defect types transformation induced by growth temperature of vertical graphene nanosheets
摘要： The in?uence factors on the defect types in vertical graphene nanosheets (VGNs) are widely researched while few systematic research has been reported on the growth temperature, which should play an important role in the transformation of defects types. In this work, VGNs were grown via plasma enhanced chemical vapor deposition (PECVD) method in the atmosphere of CH4, H2 and Ar. Based on SEM, Raman, XPS, NEXAFS and UPS spectrum analysis, we found that the types of defects in VGNs have clearly transformed from vacancy-like to boundary-like, corresponding to the rising growth temperature. Moreover, NEXAFS suggests that features near 7.7 eV are attributed to boundary-like defects, as well as (cid:1)6.7 eV in UPS, providing an intuitive and half-quantitative direction to characterize boundary-like defects in VGNs. Additionally, the sheet resistance (from 1386 to 175 Ohm/Sq) and the wetting angle (from 148(cid:3) to 121(cid:3)) decrease as the temperature rises. It shows that changing the growth temperature, as the easy and effective method, is crucial of modulating the properties of VGNs owning to the transition of defects types from vacancy-like to boundary-like.
关键词： Vertical graphene nanosheets,Near-edge X-ray absorption ?ne structure,Defects type,Ultraviolet photoemission spectroscopy,Modulate properties
更新于2025-09-23 15:22:29
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Epitaxial growth and determination of the band alignment for NixMg1-xO/MgO interface by laser molecular beam epitaxy
摘要： By laser molecular beam epitaxy, single crystalline NixMg1-xO films have been successfully synthesized on MgO(100) surface. The in situ reflection high-energy electron diffraction patterns show that the induced O2 background gas with at least 1.0 × 10?3 Pa is necessary to the epitaxial growth of NixMg1-xO films. The X-ray diffraction patterns reveal the single-phase growth along (200) direction. The energy band alignment at the interface is investigated by employing in situ X-ray photoelectron spectroscopy. The valence band offsets are determined to be from 1.47 eV to 1.50 eV with the decrease of Ni content (0.39 / 0.35). Furthermore, the work function is evaluated by using in situ ultraviolet photoemission spectroscopy, indicating the values from 4.33 eV to 4.64 eV. This study provides a promising guidance for the solar-blind device design and fabrication.
关键词： Work function,X-ray photoelectron spectroscopy,Band alignment,Ultraviolet photoemission spectroscopy,Laser molecular beam epitaxy
更新于2025-09-19 17:13:59
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Ultra-thin films of barium fluoride with low work function for thermionic-thermophotovoltaic applications
摘要： The deposition of barium fluoride thin and ultra-thin films on gallium arsenide substrates was performed by electron beam evaporation for analyzing the influence of film thickness and chemical composition on the work function of the resulting heterostructure. X-ray photoemission spectroscopy combined with ultraviolet photoemission spectroscopy measurements reveals that films of 2 nm nominal thickness and Ba/F ? 1.0 stoichiometry ratio induce the achievement of a significantly low work function of 2.1 eV to the BaFx/GaAs heterostructure. The significant reduction of the work function at least down to 3.0 eV is confirmed by a test thermionic converter operating at a cathode temperature of 1385 C, where the heterostructure was applied as anode. The low work function, together with a negligible optical absorption, makes feasible the practical application of barium fluoride coatings on GaAs within hybrid thermionic-thermophotovoltaic devices.
关键词： Ultraviolet photoemission spectroscopy,Work function,Barium fluoride,Thermionic-thermophotovoltaic energy conversion
更新于2025-09-19 17:13:59