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Quantitative determination of a model organic/insulator/metal interface structure
摘要： By combining X-ray photoelectron spectroscopy, X-ray standing waves and scanning tunneling microscopy, we investigate the geometric and electronic structure of a prototypical organic/insulator/metal interface, namely cobalt porphine on monolayer hexagonal boron nitride (h-BN) on Cu(111). Specifically, we determine the adsorption height of the organic molecule and show that the original planar molecular conformation is preserved in contrast to the adsorption on Cu(111). In addition, we highlight the electronic decoupling provided by the h-BN spacer layer and find that the h-BN–metal separation is not significantly modified by the molecular adsorption. Finally, we find indication of a temperature dependence of the adsorption height, which might be a signature of strongly-anisotropic thermal vibrations of the weakly bonded molecules.
关键词： hexagonal boron nitride,X-ray standing waves,X-ray photoelectron spectroscopy,cobalt porphine,Cu(111),scanning tunneling microscopy,organic/insulator/metal interface
更新于2025-09-04 15:30:14
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Depth-resolved electronic structure measurements by hard X-ray photoemission combined with X-ray total reflection: Direct probing of surface band bending of polar GaN
摘要： We have developed high-throughput depth-resolved electronic structure measurements using hard X-ray photoelectron spectroscopy (HAXPES) combined with X-ray total reflection (TR). By utilizing a steep change of the X-ray attenuation length around the TR condition, we controlled the effective inelastic mean-free-path of photoelectrons from >2 to >12 nm in HAXPES. We applied this method to probe the surface band bending of n-type polar GaN and found the different band bending behaviors in the Ga- and N-polar surfaces. This result is related to the surface contaminations and crystal quality near the surfaces of polar GaN.
关键词： hard X-ray photoelectron spectroscopy,surface band bending,depth-resolved electronic structure,polar GaN,X-ray total reflection
更新于2025-09-04 15:30:14
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Efficiency calibration of HPGe detector in a PGNAA system for the measurement of aqueous samples
摘要： In this work, a method was proposed for e?ciency calibration of HPGe detector employed in a prompt gamma-ray neutron activation analysis (PGNAA) system for large aqueous sample analysis. Experimental measurements of a reference surface gamma-ray source were combined with e?ciency transfer method to obtain e?ciency of a volumetric source. Then e?ciency curve over the energy range 0.5–8.5 MeV were determined with prompt gamma-rays of chlorine. To evaluate the performance of the calibration curve, an internal standard method was used to determine the aqueous sample containing manganese based on the calibration curve. The 7.058 MeV and 7.243 MeV manganese gamma-ray peaks were used to calculate the mass of manganese. The relative deviations of calculated values and actual value were 5.0% and 6.5%, respectively.
关键词： Prompt gamma-ray neutron activation analysis,E?ective solid angle,Large volumetric sample,Gamma-ray e?ciency calibration
更新于2025-09-04 15:30:14
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Fabrication of a precise ellipsoidal mirror for soft X-ray nanofocusing
摘要： In X-ray focusing, grazing incidence mirrors offer advantages of no chromatic aberration and high focusing ef?ciency. Although nanofocusing mirrors have been developed for the hard X-ray region, there is no mirror with nanofocusing performance in the soft X-ray region. Designing a system with the ability to focus to a beam size smaller than 100 nm at an X-ray energy of less than 1 keV requires a numerical aperture larger than 0.01. This leads to dif?culties in the fabrication of a soft X-ray focusing mirror with high accuracy. Ellipsoidal mirrors enable soft X-ray focusing with a high numerical aperture. In this study, we report a production process for ellipsoidal mirrors involving mandrel fabrication and replication processes. The fabricated ellipsoidal mirror was assessed under partial illumination conditions at the soft X-ray beamline (BL25SU) of SPring-8. A focal spot size of less than 250 nm was con?rmed at 300 eV. The focusing tests indicated that the proposed fabrication process is promising for X-ray mirrors that have the form of a solid of revolution, including Wolter mirrors.
关键词： soft X-ray,fabrication process,ellipsoidal mirror,nanofocusing,X-ray focusing
更新于2025-09-04 15:30:14
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Stochastic stimulated electronic x-ray Raman spectroscopy
摘要： Resonant inelastic x-ray scattering (RIXS) is a well-established tool for studying electronic, nuclear, and collective dynamics of excited atoms, molecules, and solids. An extension of this powerful method to a time-resolved probe technique at x-ray free electron lasers (XFELs) to ultimately unravel ultrafast chemical and structural changes on a femtosecond time scale is often challenging, due to the small signal rate in conventional implementations at XFELs that rely on the usage of a monochromator setup to select a small frequency band of the broadband, spectrally incoherent XFEL radiation. Here, we suggest an alternative approach, based on stochastic spectroscopy, which uses the full bandwidth of the incoming XFEL pulses. Our proposed method is relying on stimulated resonant inelastic x-ray scattering, where in addition to a pump pulse that resonantly excites the system a probe pulse on a specific electronic inelastic transition is provided, which serves as a seed in the stimulated scattering process. The limited spectral coherence of the XFEL radiation defines the energy resolution in this process and stimulated RIXS spectra of high resolution can be obtained by covariance analysis of the transmitted spectra. We present a detailed feasibility study and predict signal strengths for realistic XFEL parameters for the CO molecule resonantly pumped at the O1s ! p(cid:2) transition. Our theoretical model describes the evolution of the spectral and temporal characteristics of the transmitted x-ray radiation, by solving the equation of motion for the electronic and vibrational degrees of freedom of the system self consistently with the propagation by Maxwell equations.
关键词： CO molecule,covariance analysis,Stochastic stimulated electronic x-ray Raman spectroscopy,resonant inelastic x-ray scattering,XFEL
更新于2025-09-04 15:30:14
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Thermal atomic layer deposition of Sn metal using SnCl <sub/>4</sub> and a vapor phase silyl dihydropyrazine reducing agent
摘要： This work explores a novel, thermal atomic layer deposition (ALD) process to deposit tin metal at a low temperature. The authors employ 1,4-bis(trimethylsilyl)-1,4-dihydropyrazine (DHP) to reduce SnCl4 on silicon substrates. The authors explored a range of temperatures between 130 and 210 °C to determine the ALD window, which was found to be 170–210 °C. The authors show that this process yields a growth rate of ～0.3 ? per cycle at 190 °C. Furthermore, X-ray photoelectron spectroscopy results showed that the ?lm impurities are reduced for depositions within the ALD window. The reaction mechanism was explored using in situ mass spectrometry and in situ quartz crystal microbalance (QCM). Within the ALD temperature window, the QCM results showed a saturated mass gain during the SnCl4 exposure and a net mass loss during the DHP dose. Consistent with the QCM results, in situ mass spectroscopy data indicate that the DHP exposure step removes surface Cl via formation of volatile trimethylsilyl chloride and pyrazine by-products, effectively reducing the oxidation state of surface-bound Sn. This work is the ?rst thermal Sn metal ALD process to be reported in literature and the oxidation/reduction chemistry presented here may be applied to other metal precursors, increasing the applicability of metal ALD use in industry.
关键词： quartz crystal microbalance,X-ray photoelectron spectroscopy,ALD window,SnCl4,mass spectrometry,tin metal,thermal atomic layer deposition,DHP
更新于2025-09-04 15:30:14
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Kossel Effect in Periodic Multilayers
摘要： The Kossel effect is the diffraction by a periodically structured medium, of the characteristic X-ray radiation emitted by the atoms of the medium. We show that multilayers designed for X-ray optics applications are convenient periodic systems to use in order to produce the Kossel effect, modulating the intensity emitted by the sample in a narrow angular range defined by the Bragg angle. We also show that excitation can be done by using photons (X-rays), electrons or protons (or charged particles), under near normal or grazing incident geometries, which makes the method relatively easy to implement. The main constraint comes from the angular resolution necessary for the detection of the emitted radiation. This leads to small solid angles of detection and long acquisition times to collect data with sufficient statistical significance. Provided this difficulty is overcome, the comparison or fit of the experimental Kossel curves, i.e., the angular distributions of the intensity of an emitted radiation of one of the element of the periodic stack, with the simulated curves enables getting information on the depth distribution of the elements throughout the multilayer. Thus the same kind of information obtained from the more widespread method of X-ray standing wave induced fluorescence used to characterize stacks of nanometer period, can be obtained using the Kossel effect.
关键词： Multilayer,Bragg Diffraction,X-ray Fluorescence,Interface,Kossel Effect
更新于2025-09-04 15:30:14
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Investigation of the Atomic Structure of Ge-Sb-Se Chalcogenide Glasses
摘要： Glasses with composition of GexSb40-xSe60 (x= 40, 35, 32, 27, 20, 15 at. %) have been synthesized. Neutron and X-ray diffraction techniques were used to study the atomic glassy structure, and Reverse Monte Carlo (RMC) simulations were applied to model the 3-dimensional atomic configurations and thorough mapping of the atomic parameters, such as first and second neighbour distances, coordination numbers, and bond-angle distributions. The results are explained with formation of GeSe4 and SbSe3 structural units, which correlate with the Ge/Sb ratio. For all the studied compositions, the Ge-Se, Sb-Se, Ge-Ge, and Se-Se bonds are significant. RMC simulations reveal the presence of Ge-Sb and Sb-Sb bonds, being dependent on Ge/Sb ratio. All atomic compositions satisfy formal valence requirements, i.e., Ge is fourfold coordinated, Sb is threefold coordinated, and Se is twofold coordinated. By increasing the Sb content, both the Se-Ge-Se bonds angle of 107±3° and Se-Sb-Se bonds angle of 118±3° decrease, respectively, indicating distortion of the structural units. Far infrared Fourier Transform spectroscopic measurements conducted in the range of 50-450 cm-1 of oblique (75°) incidence radiation have revealed clear dependences of the IR band’s shift and intensity on the glassy composition, showing features around x=27 at.% supporting the topological phase transition to a stable rigid network consisting mainly of SbSe3 pyramidal and GeSe4 tetrahedral clusters. These results are in agreement with the Reverse Monte Carlo models, which define the Ge and Sb environment.
关键词： X-ray diffraction,chalcogenide glasses,atomic structure,FTIR spectroscopy,Ge-Sb-Se,neutron diffraction,Reverse Monte Carlo
更新于2025-09-04 15:30:14
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Effect of Forestry Management and Veneer Defects Identified by X-ray Analysis on Mechanical Properties of Laminated Veneer Lumber Beams Made of Beech
摘要： Interest in the use of beech as a raw material in engineered wood products for structural purpose has increased in Europe, in particular laminated veneer lumber (LVL). Indeed, this kind of product has exhibited superior mechanical properties with a lower variability compared to solid wood. This study investigated the influence of the forestry management system (e.g., high forest versus coppice) and of the veneer defects (e.g., knots and joints) on the mechanical properties of beech laminated veneer lumber (LVL) beams. The research included the measurement of modulus of elasticity and bending strength of 40 LVL beams (50 x 50 x 1200 mm3). Bending strength and modulus of elasticity of beam made from high forest wood compared to coppice wood were respectively higher by 20% and 12%. The impact of natural and manufacturing-process defects on the bending strength was studied using an X-ray imaging system. Defects in the inner layer of LVL beams were detected via X-ray. The defects produced by the manufacturing process itself had an effect on the bending strength similar to the natural defects of wood.
关键词： LVL,Mechanical properties,Beech,Coppice,X-ray,High forest
更新于2025-09-04 15:30:14
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Effect of Sputtering Technique and Properties of TiO2 Doped with SnO2 Thin Films
摘要： Doped oxide materials of 90% of TiO2 was doped with 10% of SnO2 that target has been deposited at a substrate temperature of 250°C for 1 hour by using DC Sputtering technique. The as synthesized target was TiO2-SnO2 was used to deposit on the glass substrates. The deposited oxide thin film was characterized for their structural, surface morphological, electrical and optical properties. X-ray diffraction is used for studying the nature and structure, scanning electron, atomic force microscopy and transmission electron microscopy are used to identify the surface morphology of the prepared films. The Van der Pauw technique is employed to measure electrical resistivity and Hall mobility of the film. Wide varieties of methods are available for measuring thin film thicknesses. Stylus profilometry will be helpful to find the thickness of the film, structural studies by X-ray, and micros structural analysis of the film.
关键词： Scanning Electron microscopy (SEM),Stylus profilometry,TiO2-SnO2,X-ray diffraction (XRD),UV-Vis-NIR spectrometer
更新于2025-09-04 15:30:14