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Nondestructive nanofabrication on monocrystalline silicon via site-controlled formation and removal of oxide mask
摘要： A nondestructively patterned silicon substrate serves as an ideal support for forming high-quality optical structures or devices. A new approach was proposed for fabricating site-controlled structures without destruction on a monocrystalline silicon surface via local anodic oxidation (LAO) and two-step postetching. The nondestruction was demonstrated by conductivity detection with conductive atomic force microscopy (AFM), and an almost perfect crystal lattice was observed from the fabricated hillock by high-resolution transmission electron microscopy (HRTEM). By programming AFM tip traces for LAO processing, site-controlled nondestructive patterns with di?erent layouts can be produced. This approach provides a new route for realizing nondestructive optical substrates.
关键词： conductive atomic force microscopy,high-resolution transmission electron microscopy,local anodic oxidation,nondestructive nanofabrication,monocrystalline silicon
更新于2025-11-14 17:04:02
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Superdomain structure and high conductivity at the vertices in the (111)-oriented epitaxial tetragonal Pb(Zr,Ti)O3 thin film
摘要： Recently, in ferroelectric materials, there have been many experimental efforts to find out more intriguing topological objects and their functionalities, such as conduction property. Here we investigated ferroelectric domain structures and related topological defects in the (111)-oriented epitaxial tetragonal PbZr0.35Ti0.65O3 thin film. Systematic piezoresponse force microscopy measurements revealed that the field-induced polarization switching can form thermodynamically stable superdomain structures composed of nano-sized stripe sub-domains. Within such superdomain structures, we observed the exotic equilateral triangular in-plane flux-closure domains composed of three stripe domain bundles with 120/120/120 degrees of separation. The conductive-atomic force microscopy measurements under vacuum showed that some vertices have significantly higher conductivity compared to other surrounding regions. This work highlights electric field-driven polarization switching and unique crystallographic symmetry (here, three-fold rotational symmetry) can generate exotic ferroelectric domain structures and functional topological defects, such as conductive vertices.
关键词： Vertex,Ferroelectric,Superdomain,Flux-closure domain,Piezoresponse force microscopy,Conductive-atomic force microscopy
更新于2025-09-23 15:23:52
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Direct nanoscale mapping of open circuit voltages at local back surface fields for PERC solar cells
摘要： The open circuit voltage (VOC) is a critical and common indicator of solar cell performance as well as degradation, for panel down to lab-scale photovoltaics. Detecting VOC at the nanoscale is much more challenging, however, due to experimental limitations on spatial resolution, voltage resolution, and/or measurement times. Accordingly, an approach based on Conductive Atomic Force Microscopy is implemented to directly detect the local VOC, notably for monocrystalline Passivated Emitter Rear Contact (PERC) cells which are the most common industrial-scale solar panel technology in production worldwide. This is demonstrated with cross-sectioned monocrystalline PERC cells around the entire circumference of a poly-aluminum-silicide via through the rear emitter. The VOC maps reveal a local back surface ?eld extending * 2 lm into the underlying p-type Si absorber due to Al in-diffusion as designed. Such high spatial resolution methods for photovoltaic performance mapping are especially promising for directly visualizing the effects of processing parameters, as well as identifying signatures of degradation for silicon and other solar cell technologies.
关键词： solar cell,nanoscale,Conductive Atomic Force Microscopy,open circuit voltage,PERC cells
更新于2025-09-23 15:21:01
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Direct Observation of Crystal Engineering in Perovskite Solar Cells in a Moisture-Free Environment using Conductive Atomic Force Microscopy and Friction Force Microscopy
摘要： The origin of the increased efficiency of perovskite solar cells by control of environmental humidity was investigated using conductive atomic force microscopy (C-AFM) and friction force microscopy (FFM). The perovskite thin films fabricated in a humidity-free environment exhibited better crystallinity and lower number of trap sites than the films fabricated in a high-humidity environment. Through in-depth analysis using C-AFM and FFM, we found that there was locally decrystallized area in the perovskite structure fabricated in a high-humidity environment. By suppressing local decrystallization in a humidity-free environment, the power conversion efficiency (PCE) was increased by about 122%. This was mainly attributed to increase of the current density that elimination of the locally decrystallized area increase the effective active area. From this perspective, mapping local current and friction force using C-AFM and FFM could be new techniques for visualizing the effect of crystal engineering of perovskite solar cells in a humidity-free environment.
关键词： power conversion efficiency,crystallinity,perovskite solar cells,friction force microscopy,conductive atomic force microscopy,humidity
更新于2025-09-23 15:19:57
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Emerging Conductive Atomic Force Microscopy for Metal Halide Perovskite Materials and Solar Cells
摘要： Metal halide perovskite materials, benefiting from a combination of outstanding optoelectronic properties and low-cost solution-preparation processes, show tremendous potential for optoelectronics and photovoltaics. However, the nanoscale inhomogeneities of the electronic properties of perovskite materials cause a number of difficulties, such as recombination, stability, and hysteresis, all of which seriously restrict device performance. Scanning probe microscopy, as a high-resolution imaging technique, has been widely used to connect local properties and micro-area morphologies to overall device performance. Conductive atomic force microscopy (C-AFM) can realize a real-space visualization of topography coupled with optoelectronic properties on a microscopic scale and thereby is uniquely suited to probe the local effects of perovskite materials and devices. The fundamental principles, alternative operation modes, and development of C-AFM are comprehensively reviewed, and applications in perovskite solar cells (PSCs) for electronic transport behavior, ion migration and hysteresis, ferroelectric polarization, and facet orientation investigation are discussed. A comprehensive understanding and summary of up-to-date applications in PSCs is beneficial to further fully exploit the potential of such an emerging technique, so as to provide a novel and effective approach for perovskite materials analysis.
关键词： ferroelectricity,perovskite solar cells,conductive atomic force microscopy,ion migration,perovskite materials,electronic transport behavior
更新于2025-09-19 17:13:59
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Carrier Multiplication in PbS Quantum Dots Anchored on a Au Tip using Conductive Atomic Force Microscopy
摘要： Carrier multiplication (CM) is the amplification of the excited carrier density by two times or more when the incident photon energy is larger than twice the bandgap of semiconductors. A practical approach to demonstrate the CM involves the direct measurement of photocurrent in the device. Specifically, photocurrent measurement in quantum dots (QDs) is typically limited by high contact resistance and long carrier-transfer length, which yields a low CM conversion efficiency and high CM threshold energy. Here, the local photocurrent is measured to evaluate the CM quantum efficiency from a QD-attached Au tip of a conductive atomic force microscope (CAFM) system. The photocurrent is efficiently measured between the PbS QDs anchored on a Au tip and a graphene layer on a SiO2/Si substrate as a counter electrode, yielding an extremely short channel length that reduces the contact resistance. The quantum efficiency extracted from the local photocurrent data with an incident photon energy exhibits a step-like behavior. More importantly, the CM threshold energy is as low as twice the bandgap, which is the lowest threshold energy of optically observed QDs to date. This enables the CAFM-based photocurrent technique to directly evaluate the CM conversion efficiency in low-dimensional materials.
关键词： lead sulfide quantum dots,conductive atomic force microscopy,carrier multiplication,photocurrent measurement
更新于2025-09-16 10:30:52
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Formation and characterization of charge coupled structure of polyoxometalate particles and a GaAs-based nanowire for readout of molecular charge states
摘要： To investigate the molecular charge dynamics of polyoxometalate (POM) molecules, we formed and characterized a charge coupled structure with POM molecular particles and a GaAs-based nanowire. In our system, the charge sensitivity was locally increased by capacitive coupling between a metal tip and the POM particle. Surface dispersion of POM particles on the GaAs nanowire was carried out in a controlled manner by choosing an appropriate solvent and POM concentration. We found that, after POM surface dispersion, the current in the GaAs nanowire remarkably increased by charging the POM particles using a conductive atomic force microscopy tip. The current change strongly depended on humidity of the measurement environment. The nanowire current under capacitive coupling between the conductive tip and the POM particle on the nanowire surface showed steps with a height of approximately 70 nA, suggesting that multiple hole charging and discharging occurred in the particle in a synchronized manner.
关键词： conductive atomic force microscopy,GaAs-based nanowire,molecular charge states,charge coupled structure,polyoxometalate
更新于2025-09-11 14:15:04