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[IEEE 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Paris, France (2018.7.8-2018.7.13)] 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Keysight 3458A Internal Clock Performance
摘要： This paper describes a detection and measurement of 100 ns sample clock time jumps that can be observed for the Keysight 3458A digital multimeter when sampling with an internal sampling clock. In most cases such time jumps do not affect the measurement results. However, to achieve the highest accuracy in sampled measurements this might be an important parameter. The results on two DMMs over a two year period are presented, indicating a possible occurrence of time jumps and their mitigation.
关键词： time jumps,phase,sample time,stability,time jitter,long term sampling
更新于2025-09-10 09:29:36
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Research on Time Jitter of GaAs Photoconductive Semiconductor Switches in the Negative Differential Mobility Region
摘要： Time jitter of GaAs photoconductive semiconductor switches (PCSS) is investigated at an optical excitation of 1053 nm wavelength and 500 ps pulse duration. The experimental results indicate that the time jitter of the GaAs PCSS exhibits a nonmonotonic variation in negative differential mobility (NDM) region. All of these time jitters are lower than the 4% of the rise time of the switching waveform. The optimum time jitter of ~15 ps is achieved at the onset of the NDM region. The theoretical relationship between the optical excitation parameters, the bias electric field and the time jitter of the GaAs PCSS are built up. The nonmonotonic behavior of the time jitter with electric field is attributed to the instability of the relative fluctuation of drift velocity caused by inter-valley transition of carriers in GaAs.
关键词： inter-valley transition of carriers,photoconductive semiconductor switches,gallium arsenide (GaAs),negative differential mobility (NDM),time jitter
更新于2025-09-04 15:30:14