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Multiple epitaxial lift-off of stacked GaAs solar cells for low-cost photovoltaic applications
摘要： This paper presents a multilayer peeling from a stacked cell structure as an approach for the cost reduction of III–V solar cells. We demonstrate the separation of two-layer stacked GaAs solar cells with Al(Ga)As release layers on the GaAs substrate into individual layers without cracks. The cells in each layer peeled from the stacked structure show equivalent device performances. Thermal cycling tests with repeated heating to 85 °C and cooling to ?40 °C show that the flexible GaAs thin-film cell exhibits a high durability against temperature changes. Further, a damp heat test conducted at 85 °C and 85% humidity indicates that the cell has long-term stability. These results suggest that the flexible GaAs thin-film cells fabricated by peeling from stacked structures have a high reliability and prove that the separation of the stacked cell structures into individual layers is effective in fabricating low-cost III–V solar cells.
关键词： epitaxial lift-off,cost reduction,damp heat test,photovoltaic applications,thermal cycling,GaAs solar cells
更新于2025-09-23 15:19:57
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An Influence of the Module Structure on Reliability of Crystalline Silicon Solar Cells
摘要： To investigate the influence of the difference in module structures on the degradation of crystalline silicon solar cells, two different photovoltaic modules were fabricated, and a high-temperature and high-humidity test was carried out. The degradation modes of these modules were compared to each other using electrical characteristics and electroluminescence images. Degradation of outputs occurred in both modules, and different degradation modes were confirmed by electroluminescence images. The difference in degradation modes between these modular structures could be due to the difference in concentration distribution attributable to the moisture and acetic acid generated from the encapsulant inside the module.
关键词： Moisture Ingress,Metallization,Damp Heat Test,Corrosion,Aluminum,Photovoltaic Module,Silver Paste
更新于2025-09-19 17:13:59
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Imaging and micro-structural characterization of moisture induced degradation in crystalline silicon photovoltaic modules
摘要： Moisture induced degradation in photovoltaic (PV) modules operate via multiple chemical mechanisms commonly identi?ed by the sole use of destructive techniques. However, in such cases, e?ective use of spatial imaging techniques can aid identi?cation of certain operating mechanisms on the basis of degradation pattern characteristics. This paper presents an approach of imaging the e?ects of moisture induced degradation in crystalline silicon PV modules under damp heat (DH) test conditions using electroluminescence (EL) and dark lock-in-thermography (DLIT) imaging techniques. The a?ected regions were extracted for identi?cation of degradation products using scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) micro-structural characterization technique. Consequently, combination of both imaging and micro-structural characterization techniques were used to propose the mechanism of degradation. The presented approach was instrumental in identi?cation of the e?ects of moisture induced degradation through imaging techniques, moreover the investigation also provided insights in this ?eld of work. The results present signature image patterns for identi?cation and di?erentiation of dominant chemical mechanisms under moisture induced conditions viz. tin migration at the ?nger-wafer interface and formation of silver oxide at cell cracks and edges. The ribbon interconnects was identi?ed as an active site for deposition of oxides from solder material, and aluminium electrode in presence of water as an electrolyte. Moreover, loss in interfacial adhesion between wafer, encapsulant and ?nger. In addition, material quality, manufacturing distinctions, and module design parameters seem to be responsible for observing di?erent operating mechanisms. Also, the obtained insights were applied for investigation of a 20-year-old aged PV module.
关键词： Chemical degradation,Damp heat test,Photovoltaic modules,Electroluminescence imaging,Dark lock-in thermography imaging,Moisture induced degradation
更新于2025-09-11 14:15:04