摘要： Moisture induced degradation in photovoltaic (PV) modules operate via multiple chemical mechanisms commonly identi?ed by the sole use of destructive techniques. However, in such cases, e?ective use of spatial imaging techniques can aid identi?cation of certain operating mechanisms on the basis of degradation pattern characteristics. This paper presents an approach of imaging the e?ects of moisture induced degradation in crystalline silicon PV modules under damp heat (DH) test conditions using electroluminescence (EL) and dark lock-in-thermography (DLIT) imaging techniques. The a?ected regions were extracted for identi?cation of degradation products using scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) micro-structural characterization technique. Consequently, combination of both imaging and micro-structural characterization techniques were used to propose the mechanism of degradation. The presented approach was instrumental in identi?cation of the e?ects of moisture induced degradation through imaging techniques, moreover the investigation also provided insights in this ?eld of work. The results present signature image patterns for identi?cation and di?erentiation of dominant chemical mechanisms under moisture induced conditions viz. tin migration at the ?nger-wafer interface and formation of silver oxide at cell cracks and edges. The ribbon interconnects was identi?ed as an active site for deposition of oxides from solder material, and aluminium electrode in presence of water as an electrolyte. Moreover, loss in interfacial adhesion between wafer, encapsulant and ?nger. In addition, material quality, manufacturing distinctions, and module design parameters seem to be responsible for observing di?erent operating mechanisms. Also, the obtained insights were applied for investigation of a 20-year-old aged PV module.