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Synthesis, Morphology, Optical and Electrical Properties of Cu <sub/> 1? <i>x</i> </sub> Fe <sub/><i>x</i> </sub> O Nanopowder
摘要： The pure and Fe-doped CuO nanoparticles of the series Cu1?xFexO (x = 0, 0.027, 0.055, 0.097 and 0.125) were synthesized by a simple low temperature sol–gel method. Synthesized samples were characterized by a series of techniques including Field Emission Scanning Electron Microscope (FESEM), Energy Dispersive X-ray electron spectroscopy (EDX), Diffuse Reflectance Spectroscopy (DRS), Fourier Transform Infrared Spectroscopy (FTIR), Hall Effect Set-up and Current–Voltage (I–V) characteristics. FESEM analysis shows formation of disc type structure increasing in grain size with Fe concentration in CuO. EDX confirmed the incorporation of iron in CuO. FTIR results of pure and Fe doped CuO samples have confirmed the formation of monoclinic CuO. The optical band gap estimated using Diffuse Reflectance Spectroscopy (DRS) shows the increment in the band gap values with Fe substitution. The Hall measurements show predominantly p-type conduction in all the samples and carrier densities decrease with increased Fe substitution. I–V characteristics of pure and Fe doped CuO nanoparticles show rectification behaviour of Schottky diodes.
关键词： Defect States,Hall Effect,Schottky Diode,Cation Vacancies,Fe-Substituted CuO
更新于2025-11-19 16:56:35
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High Breakdown Strength Schottky Diodes Made from Electrodeposited ZnO for Power Electronics Applications
摘要： The synthesis of ZnO films by optimized electrodeposition led to the achievement of a critical electric field of 800 kV/cm. This value, which is 2 to 3 times higher than in monocrystalline silicon, was derived from a vertical Schottky diode application of columnar-structured ZnO films electrodeposited on platinum. The device exhibited a free carrier concentration of 2.5 × 10^15 cm^-3, a rectification ratio of 3 × 10^8 and an ideality factor of 1.10, a value uncommonly obtained in solution-processed ZnO. High breakdown strength and high thickness capability make this environment-friendly process a serious option for power electronics and energy-harvesting.
关键词： breakdown voltage,electrodeposition,zinc oxide,critical electric field,solution-processed,Schottky diode,power diode,ideality factor
更新于2025-09-23 15:23:52
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Influence of GaN- and Si?N?-Passivation Layers on the Performance of AlGaN/GaN Diodes With a Gated Edge Termination
摘要： This paper analyses the influence of the GaN and Si3N4 passivation (or 'cap') layer on the top of the AlGaN barrier layer on the performance and reliability of Schottky barrier diodes with a gated edge termination (GET-SBDs). Both GaN cap and Si3N4 cap devices show similar dc characteristics but a higher density of traps at the SiO2/GaN interface or/and an increase of the total dielectric constant in the access region result in higher RON-dispersion in GaN cap devices. The leakage current at medium/low temperatures in both types of devices shows two low-voltage-independent activation energies, suggesting thermionic and field-emission processes to be responsible for the conduction. Furthermore, a voltage-dependent activation energy in the high-temperature range occurs from low voltages in the GaN cap devices and limits their breakdown voltage (VBD). Time-dependent dielectric breakdown measurements show a tighter distribution in Si3N4 cap devices (Weibull slope β = 3.3) compared to GaN cap devices (β = 1.8). Additional measurements in plasma-enhanced atomic layer deposition (PEALD)-Si3N4 capacitors with different cap layers and TCAD simulations show an electric field distribution with a strong peak within the PEALD-Si3N4 dielectric at the GET corner, which could accelerate the formation of a percolation path and provoke the device breakdown in GaN cap SBDs even at low-stress voltages.
关键词： Si3N4 cap,GaN cap,AlGaN/GaN Schottky diode,reliability,breakdown voltage,passivation layer,off-state,Activation energy
更新于2025-09-23 15:23:52
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Direct Imaging of Surface Plasmon-Driven Hot Electron Flux on the Au Nanoprism/TiO <sub/>2</sub>
摘要： Direct measurement of hot electron flux from a plasmonic Schottky nanodiode is important for obtaining fundamental insights explaining the mechanism for electronic excitation on a surface. Here, we report the measurement of photo-induced hot electrons on a triangular Au nanoprism on TiO2 under incident light with photoconductive atomic force microscopy (pc-AFM), which is direct proof of the intrinsic relation between hot electrons and localized surface plasmon resonance. We find that the local photocurrent measured on the boundary of the Au nanoprism is higher than that inside the Au nanoprism, indicating that field confinement at the boundary of the Au nanoprism acts as a hot spot, leading to the enhancement of hot electron flow at the boundary. Under incident illumination with a wavelength near the absorption peak (645 nm) of a single Au nanoprism, localized surface plasmon resonance resulted in the generation of a higher photo-induced hot electron flow for the Au nanoprism/TiO2, compared with that at a wavelength of 532 nm. We show that the application of a reverse bias results in a higher photocurrent for the Au nanoprism/TiO2, which is associated with a lowering of the Schottky barrier height caused by the image force. These nanoscale measurements of hot electron flux with pc-AFM indicate efficient photon energy transfer mediated by surface plasmons in hot electron-based energy conversion.
关键词： hot electron,Photoconductive atomic force microscopy,localized surface plasmon resonance,Schottky diode,field confinement,Au nanoprism
更新于2025-09-23 15:23:52
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[IEEE 2018 IEEE Energy Conversion Congress and Exposition (ECCE) - Portland, OR, USA (2018.9.23-2018.9.27)] 2018 IEEE Energy Conversion Congress and Exposition (ECCE) - Comparison Study of Surge Current Capability of Body Diode of SiC MOSFET and SiC Schottky Diode
摘要： The superior performance of the SiC MOSFETs operating in synchronous mode converter without external antiparallel SiC Schottky diodes have been demonstrated recently. However, there are few studies of the surge current capability of the SiC MOSFET's body diode, leading severe concern for its ruggedness in practical power converter applications. The purpose of this paper is to experimentally compare the non-repetitive surge current capability of the SiC MOSFET's intrinsic body diode and SiC Schottky diode, and analyze the physical mechanisms of their degradation after surge current stress. Their surge current capability and electrical characteristics before and after surge current stress are measured and analyzed. Experimental study shows that the non-repetitive peak surge current of the SiC MOSFET’s body diode is slightly larger than that of the SiC Schottky diodes. The degradation of the SiC Schottky diode after surge current stress is accompanied with the increase of drain leakage current, while the degradation of the SiC MOSFET after the body diode’s surge current stress is accompanied with the variation of the threshold voltage and input capacitance of the SiC MOSFET. The analysis shows that the degradation of the SiC MOSFET after the surge current stress may be correlated with the interface traps of SiC/SiO2 interface.
关键词： Body diode,SiC Schottky Diode,SiC MOSFET,Surge current
更新于2025-09-23 15:22:29
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Breakdown enhancement of diamond Schottky barrier diodes using boron implanted edge terminations
摘要： Boron implanted edge terminations have been demonstrated to enhance the breakdown voltages and stabilities of diamond Schottky barrier diodes (SBDs). The edge terminations were achieved by boron implant to form nonconductive amorphous regions under the edges of the Schottky contacts. Direct current measurements show the implanted regions did not contribute to the forward currents and high current densities of about 4000 A/cm2 were obtained at -5 V. By using boron implanted edge terminations, although an increase in leakage currents was observed, the average breakdown voltage of the devices was significantly improved from 79 V to 125 V, which is increased by more than 50%. In addition, the breakdown voltages of the devices without edge terminations degraded quickly after each repeating measurement, whereas the devices with edge terminations became much more stable and no obvious drop in breakdown voltages was observed.
关键词： Boron implant,Schottky diode,Diamond,Edge termination
更新于2025-09-23 15:22:29
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Large area SiC-UV phothodiode for spectroscopy portable system
摘要： In this work, we present the extensive characterization of large area Silicon Carbide based UV sensors candidate for outdoors spectroscopic applications of gas or liquid. The proposed SiC Schottky devices exhibit dark current density of 0.12 nA/cm2 @ 15 V, a 0.12 A/W responsivity @ 300 nm, optimal visible blindness and switching time of ~ 190 ns. Effects of temperature on the sensor performance, of crucial interest for outdoors applications, are also examined in the range from -20 °C to 90 °C.
关键词： optical sensor,Large area UV photodetector,Schottky diode,SiC detector
更新于2025-09-23 15:22:29
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An In-Depth Study on Electrical and Hydrogen Sensing Characteristics of ZnO Thin Film with Radio Frequency Sputtered Gold Schottky Contacts
摘要： Electrical and hydrogen sensing characteristics of radio frequency sputtered Au/ZnO thin film Schottky diodes on n-silicon substrate have been investigated over a wide temperature range. Current-voltage characterizations of the device in the temperature range of 25°C to 200°C confirm its excellent rectifying property with forward to reverse current ratio of 1610 at an external bias of 5 V. Ideality factor in the range of 4.12 to 2.98 is obtained for Au/ZnO Schottky diode in the aforementioned temperature range, at atmospheric conditions. On exposing diode to hydrogen, a reduction in ideality factor is observed which makes thermionic emission more prominent. The proposed device has proven to be hydrogen sensitive, on account of the lateral shift observed in I ? V characteristics at different hydrogen concentrations (50 ppm-1000 ppm). Maximum barrier height variation of 99 meV and sensitivity of 144% have been observed at 1000 ppm hydrogen at 200°C. A Detailed perusal of the steady-state reaction kinetics of the sensor using I ? V characteristics affirmed that the atomistic hydrogen adsorption at Au/ZnO interface is accountable for the barrier height modulation. The studied sensor depicts remarkable performance for high-temperature detection.
关键词： Hydrogen sensing,Zinc oxide (ZnO) thin film,Electrical characteristics,Schottky diode,Metal-semiconductor interface,Palladium catalyst
更新于2025-09-23 15:22:29
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Trapping Analysis of AlGaN/GaN Schottky Diodes via Current Transient Spectroscopy
摘要： Trapping effects on two AlGaN/GaN Schottky diodes with a different composition of the AlGaN barrier layer were analyzed by current transient spectroscopy. The current transients were measured at a constant bias and at six different temperatures between 25 and 150 °C. Obtained data were fitted by only three superimposed exponentials, and good agreement between the experimental and fitted data was achieved. The activation energy of dominant traps in the investigated structures was found to be within 0.77–0.83 eV. This nearly identical activation energy was obtained from current transients measured at a reverse bias of -6 V as well as at a forward bias of +1 V. It indicates that the dominant traps might be attributed to defects mainly associated with dislocations connected predominantly with the GaN buffer near the AlGaN/GaN interface.
关键词： activation energy,exponential function,Schottky diode,AlGaN/GaN,(de)trapping
更新于2025-09-23 15:22:29
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[ASME ASME 2018 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems - San Francisco, California, USA (Monday 27 August 2018)] ASME 2018 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems - Analysis of Thermal Properties of Power Multifinger HEMT Devices
摘要： In this paper, several methods suitable for real time on-chip temperature measurements of power AlGaN/GaN based high-electron mobility transistor (HEMT) grown on SiC substrate are presented. The measurement of temperature distribution on HEMT surface using Raman spectroscopy is presented. We have deployed a temperature measurement approach utilizing electrical I-V characteristics of the neighboring Schottky diode under different dissipated power of the transistor heat source. These methods are verified by measurements with micro thermistors. The results show that these methods have a potential for HEMT analysis in thermal management. The features and limitations of the proposed methods are discussed. The thermal parameters of materials used in the device are extracted from temperature distribution in the structure with the support of 3-D device thermal simulation. The thermal analysis of the multifinger power HEMT is performed. The effects of the structure design and fabrication processes from semiconductor layers, metallization, and packaging up to cooling solutions are investigated. The analysis of thermal behavior can help during design and optimization of power HEMT.
关键词： thermal properties,Raman spectroscopy,thermal management,Schottky diode,power HEMT devices
更新于2025-09-23 15:21:21