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Study of the Effect of Optical Illumination on Resistive Switching in ZrO2(Y) Films with Au Nanoparticles by Tunneling Atomic Force Microscopy
摘要： The effect of optical illumination on the resistive switching in ultrathin (~4 nm) ZrO2(Y) films with embedded single-layer Au nanoparticle arrays 2–3 nm in size is studied via tunneling atomic force microscopy. The ZrO2(Y) films with Au nanoparticles are grown by layerwise magnetron deposition onto glass substrates with a conductive indium-tin-oxide sublayer, followed by annealing at 450°C. An increase in hysteresis due to bipolar resistive switching in the ZrO2(Y) films is observed on the cyclic current–voltage curves of the microscope probe-to-sample contact. The effect is found to manifest itself in a dense Au nanoparticle array (~660 nm) when the contact area is photoexcited through a transparent substrate exposed to the radiation of a semiconductor laser at the plasmon-resonance wavelength. The effect is attributed to the photon-assisted field emission of electrons from Au nanoparticles to the conduction band of ZrO2(Y) in a strong electric field between the microscope probe and the indium-tin-oxide substrate under plasmon-resonance conditions.
关键词： plasmon resonance,resistive switching,yttrium-stabilized zirconium dioxide,metal nanoparticles,atomic force microscopy
更新于2025-11-19 16:56:35
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Nondestructive nanofabrication on monocrystalline silicon via site-controlled formation and removal of oxide mask
摘要： A nondestructively patterned silicon substrate serves as an ideal support for forming high-quality optical structures or devices. A new approach was proposed for fabricating site-controlled structures without destruction on a monocrystalline silicon surface via local anodic oxidation (LAO) and two-step postetching. The nondestruction was demonstrated by conductivity detection with conductive atomic force microscopy (AFM), and an almost perfect crystal lattice was observed from the fabricated hillock by high-resolution transmission electron microscopy (HRTEM). By programming AFM tip traces for LAO processing, site-controlled nondestructive patterns with di?erent layouts can be produced. This approach provides a new route for realizing nondestructive optical substrates.
关键词： conductive atomic force microscopy,high-resolution transmission electron microscopy,local anodic oxidation,nondestructive nanofabrication,monocrystalline silicon
更新于2025-11-14 17:04:02
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Superdomain structure and high conductivity at the vertices in the (111)-oriented epitaxial tetragonal Pb(Zr,Ti)O3 thin film
摘要： Recently, in ferroelectric materials, there have been many experimental efforts to find out more intriguing topological objects and their functionalities, such as conduction property. Here we investigated ferroelectric domain structures and related topological defects in the (111)-oriented epitaxial tetragonal PbZr0.35Ti0.65O3 thin film. Systematic piezoresponse force microscopy measurements revealed that the field-induced polarization switching can form thermodynamically stable superdomain structures composed of nano-sized stripe sub-domains. Within such superdomain structures, we observed the exotic equilateral triangular in-plane flux-closure domains composed of three stripe domain bundles with 120/120/120 degrees of separation. The conductive-atomic force microscopy measurements under vacuum showed that some vertices have significantly higher conductivity compared to other surrounding regions. This work highlights electric field-driven polarization switching and unique crystallographic symmetry (here, three-fold rotational symmetry) can generate exotic ferroelectric domain structures and functional topological defects, such as conductive vertices.
关键词： Vertex,Ferroelectric,Superdomain,Flux-closure domain,Piezoresponse force microscopy,Conductive-atomic force microscopy
更新于2025-09-23 15:23:52
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Disentangling topographic contributions to near-field scanning microwave microscopy images
摘要： We develop empirical models to predict the contribution of topographic variations in a sample to near-field scanning probe microwave microscopy (NSMM) images. In particular, we focus on |S11| images of a thin Perovskite photovoltaic material and a GaN nanowire. The difference between the measured NSMM image and this prediction is our estimate of the contribution of material property variations to the measured image. Prediction model parameters are determined from either a reference sample that is nearly free of material property variations or directly from the sample of interest. The parameters of the prediction model are determined by robust linear regression so as to minimize the effect of material property variations on results. For the case where the parameters are determined from the reference sample, the prediction is adjusted to account for instrument drift effects. Our statistical approach is fully empirical and thus complementary to current approaches based on physical models that are often overly simplistic.
关键词： Near-field scanning probe microwave microscopy,Signal extraction,GaN nanowire,Statistical methods,Perovskite materials,Atomic force microscopy
更新于2025-09-23 15:23:52
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[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Characterization of Multilayered Ceramic Capacitors via Piezoelectric Force Microscopy
摘要： The coupling between an electrical and mechanical response in a material is a fundamental property that provides functionality to a variety of applications ranging from sensors and actuators to energy harvesting and biology. Most materials exhibit electromechanical coupling in nanometer-sized domains. Therefore, to understand the relationship between structure and function of these materials, characterization on the nanoscale is required. This property can be directly measured in a non-destructive manner using piezoelectric force microscopy (PFM), a mode that comes standard in all atomic force microscopes (AFMs) from Park Systems. Additionally, PFM can be used as a spectroscopic tool to evaluate switching of piezoelectric domains. Here we demonstrate the utility of PFM for failure analysis of a multilayered ceramic capacitor. Correlative imaging of topography and electrical signals revealed discontinuous structures in the device that likely had a direct effect on device performance. Spectroscopy was also performed at a specific piezoelectric region to measure domain properties, such as the electric field required to flip the polarization direction (coercive voltage).
关键词： topography,atomic force microscopy,multilayered ceramic capacitor,electromechanics,piezoelectric microscopy,polarization,failure analysis
更新于2025-09-23 15:23:52
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Surfactant templated oriented 1-D nanoscale platinum and palladium systems on a modified silicon surface
摘要： A templating method has been improved to form oriented one-dimensional metal nanostructures on a silicon surface. To achieve this, the silicon surface is modified with 3-aminopropyl trimethoxysilane. The cationic surfactant cetyltrimethylammonium bromide is used as a micellar template. The average width of the obtained Pt strips is 35 nm, the average width of the obtained Pd strips is 60 nm.
关键词： Platinum group,Atomic force microscopy,Surface modification,Nanostructured materials,Micelle templates
更新于2025-09-23 15:23:52
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The stability and degradation of PECVD fluoropolymer nanofilms
摘要： Fluoropolymer films are frequently used in microfabrication and for producing hydrophobic and low-k dielectric layers in various applications. As the reliability of functional coatings is becoming a more pressing issue in industry, it is necessary to determine the physical stability and degradation properties of this important class of films. To this end, a study has been undertaken to ascertain the aging characteristics of fluoropolymer films under various environmental conditions that such a film may experience during its use. In particular, fluorocarbon films formed by plasma-enhanced chemical vapour deposition (PECVD) using octafluorocyclobutane, or c-C4F8, as a precursor gas have been exposed to abrasive wear, elevated temperatures, ultraviolet radiation, as well as oxygen plasma and SF6 plasma, the latter being commonly used in conjunction with these films in ion etching processes. The results show that sub-micron thick fluoropolymer films exhibit a significant amount of elastic recovery during nanoscratch tests, minimising the impact of wear. The films exhibit stability when exposed to 365 nm UV light in air, but not 254 nm light in air, which generated significant decreases in thickness. Exposure to temperatures up to 175 °C did not generate loss of material, whereas temperatures higher than 175 °C did. Etching rates upon exposure to oxygen and SF6 plasmas were also measured.
关键词： Octafluorocyclobutane,Plasma deposition,Atomic force microscopy,Wear,Ellipsometry
更新于2025-09-23 15:23:52
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A single-stranded coordination copolymer affords heterostructure observation and photoluminescence intensification
摘要： Few artificial systems can be exfoliated into, and observed as, single wires with lengths of more than several micrometers, and no previous example features a copolymer structure; this is in contrast with biopolymers such as single-strand DNAs. Here, we create a set of one-dimensional coordination copolymers featuring bis(dipyrrinato)zinc complex motifs in the main chain. A series of random copolymers is synthesized from two types of bridging dipyrrin proligand and zinc acetate, with various molar ratios between the proligands. Sonication of the bulk solid copolymer in organic solvent exfoliates single strands with lengths of 1.4 to 3.0 mm. Atomic force microscopy at ambient conditions visualizes the copolymer structure as height distributions. The copolymer structure improves its photoluminescence (up to 32%) relative to that of the corresponding homopolymers (3 and 10%). Numerical simulation based on a restricted random walk model reproduces the photoluminescence intensification, suggesting at the same time the existence of fast intrawire exciton hopping.
关键词： exciton hopping,atomic force microscopy,photoluminescence,coordination copolymer,heterostructure
更新于2025-09-23 15:23:52
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Molecular Identification, Bond Order Discrimination, and Apparent Intermolecular Features in Atomic Force Microscopy Studied with a Charge Density Based Method
摘要： We introduce an efficient method to simulate high-resolution atomic force microscopy (HR-AFM) images with CO probes. Our model explicitly takes into account the charge densities of the sample and the probe for the calculation of the short-range (SR) interaction and retains ab initio accuracy with only two parameters, that are essentially universal, independent of the number of chemical species and the complexity of the bonding topology. The application to molecular images shows a strong dependence on the stoichiometry and bonding configuration that precludes the chemical identification of individual atoms based on local force–distance curves. However, we have identified features in the 2D images and 3D force maps that reflect the highly anisotropic spatial decay of the molecular charge density and provide a way towards molecular identification. The model treats SR and electrostatics interactions on an equal footing and correctly pinpoints the Pauli repulsion as the underlying interaction responsible for the bond order discrimination in C60. Finally, we settle the controversy regarding the origin of the intermolecular features, discarding the effect of the charge redistribution associated with the H bonds, and linking them with the overlap of the wave functions of the atoms that constitute the bond. This overlap creates saddle regions in the potential energy landscape that are sensed by the probe.
关键词： tip functionalization,DFT,chemical identification,CO molecule,hydrogen bonds,non–contact atomic force microscopy,bond order
更新于2025-09-23 15:23:52
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Direct Imaging of Surface Plasmon-Driven Hot Electron Flux on the Au Nanoprism/TiO <sub/>2</sub>
摘要： Direct measurement of hot electron flux from a plasmonic Schottky nanodiode is important for obtaining fundamental insights explaining the mechanism for electronic excitation on a surface. Here, we report the measurement of photo-induced hot electrons on a triangular Au nanoprism on TiO2 under incident light with photoconductive atomic force microscopy (pc-AFM), which is direct proof of the intrinsic relation between hot electrons and localized surface plasmon resonance. We find that the local photocurrent measured on the boundary of the Au nanoprism is higher than that inside the Au nanoprism, indicating that field confinement at the boundary of the Au nanoprism acts as a hot spot, leading to the enhancement of hot electron flow at the boundary. Under incident illumination with a wavelength near the absorption peak (645 nm) of a single Au nanoprism, localized surface plasmon resonance resulted in the generation of a higher photo-induced hot electron flow for the Au nanoprism/TiO2, compared with that at a wavelength of 532 nm. We show that the application of a reverse bias results in a higher photocurrent for the Au nanoprism/TiO2, which is associated with a lowering of the Schottky barrier height caused by the image force. These nanoscale measurements of hot electron flux with pc-AFM indicate efficient photon energy transfer mediated by surface plasmons in hot electron-based energy conversion.
关键词： hot electron,Photoconductive atomic force microscopy,localized surface plasmon resonance,Schottky diode,field confinement,Au nanoprism
更新于2025-09-23 15:23:52