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A Beginners' Guide to Scanning Electron Microscopy || Imaging with the SEM
摘要： The scanning electron microscope is routinely used to characterize wide-ranging materials due to its ease of operation and relatively straightforward sample preparation as well as due to simple image interpretation. New users can readily obtain images after little practice. However, high-resolution microscopy and examination of “difficult” samples require experience and know-how of the principles of image formation in the SEM. This chapter describes the role of various operational parameters used during microscopy in more detail. The effect of these parameters on contrast, resolution, and depth of field depicted by images is discussed. Pros and cons of microscopy conditions that have a direct bearing on the quality of images, type of information obtained, and image interpretation are elaborated. Guidelines for operation and upkeep of the SEM instrument are also summarized in this chapter.
关键词： high-resolution microscopy,operational parameters,resolution,scanning electron microscope,SEM,image formation,contrast,microscopy conditions,image interpretation,depth of field
更新于2025-09-23 15:19:57
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Customized MFM probes with high lateral resolution
摘要： Magnetic force microscopy (MFM) is a widely used technique for magnetic imaging. Besides its advantages such as the high spatial resolution and the easy use in the characterization of relevant applied materials, the main handicaps of the technique are the lack of control over the tip stray field and poor lateral resolution when working under standard conditions. In this work, we present a convenient route to prepare high-performance MFM probes with sub-10 nm (sub-25 nm) topographic (magnetic) lateral resolution by following an easy and quick low-cost approach. This allows one to not only customize the tip stray field, avoiding tip-induced changes in the sample magnetization, but also to optimize MFM imaging in vacuum (or liquid media) by choosing tips mounted on hard (or soft) cantilevers, a technology that is currently not available on the market.
关键词： magnetic materials,AFM probes,high-resolution microscopy,atomic force microscopy (AFM),magnetic force microscopy (MFM)
更新于2025-09-04 15:30:14