研究目的
To present a convenient route to prepare high-performance MFM probes with sub-10 nm (sub-25 nm) topographic (magnetic) lateral resolution by following an easy and quick low-cost approach.
研究成果
The custom-made MFM probes achieve lateral resolutions at least as good as commercial super-sharp tips (10 nm and 25 nm in topographic and MFM images, respectively). A particular advantage is the possibility of coating tips mounted on hard/soft cantilevers to optimize imaging in vacuum/liquid environments, providing enhanced sensitivity compared to standard probes.
研究不足
The achievable resolution is not greatly enhanced compared to commercial tips so their applicability is limited to particular cases of interest. The balance between resolution and sensitivity must be found depending on the specific properties of each sample.
1：Experimental Design and Method Selection:
The method involves sputter coating commercial AFM sensors with a polycrystalline Co thin film using a custom-built AC magnetron sputtering system.
2：Sample Selection and Data Sources:
Commercial AFM probes and a high density hard disk with perpendicular anisotropy based on a CoCrPt alloy were used.
3：List of Experimental Equipment and Materials:
Custom-built AC magnetron sputtering system, commercial AFM sensors, Co thin film.
4：Experimental Procedures and Operational Workflow:
The deposition parameters were carefully chosen to yield highly flat surfaces with small grain size. The magnetic properties of the reference Co/Si sample were analyzed.
5：Data Analysis Methods:
MFM data correspond to the shift in the resonance frequency of the cantilever recorded during the retrace scan.
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